ArticleScience advances2026
Repurposing Si CMOS nonidealities for stochastic and analog image processing.
Article in Science advances, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 2 papers.
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Who cites it
2 citing papers in PubMed.
- Defect-mediated generation-recombination dynamics governing conductance response in floating-body transistors.Microsystems & nanoengineering · 2026Article
- A novel observation of negative differential resistance in a standard CMOS transistor and its application to a compact frequency doubler.Microsystems & nanoengineering · 2026Article
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Authors and funding
12 authors.
Funding
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Abstract
Conventional semiconductor device engineering regards intrinsic device nonidealities as reliability concerns to be minimized or eliminated. Here, we demonstrate the strategic repurposing of these nonidealities as functional resources for advanced stochastic analog computing. We leverage two underutilized phenomena-deep-level channel trap-induced generation-recombination (G-R) noise and impact ionization-induced negative differential resistance (NDR) in body current-which have received limited attention compared to the extensively studied 1/
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Registered trials
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