Evidence map›Paper›PMID 41706221›Full record

ArticleJournal of molecular modeling2026

Atomic scale deformation mechanisms in Cu/Zr multilayers in nano-scratching processes.

Ruihan Li, Xiangchen Li, Huan Liu, Pengyue Zhao

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Article in Journal of molecular modeling, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

4 authors.

Ruihan LiCenter of Ultra-Precision Optoelectronic Instrumentation Engineering, Harbin Institute of Technology, Harbin, 150001, China.
Xiangchen LiDepartment of Applied Mathematics, Duke Kunshan University, Suzhou, 215316, China.
Huan LiuCenter of Ultra-Precision Optoelectronic Instrumentation Engineering, Harbin Institute of Technology, Harbin, 150001, China. hliu@hit.edu.cn.
Pengyue ZhaoCenter of Ultra-Precision Optoelectronic Instrumentation Engineering, Harbin Institute of Technology, Harbin, 150001, China. pyzhao@hit.edu.cn.

Funding

China National Key Research and Development Plan 2023YFF0612501National Natural Science Foundation of China 52575616,52405585 and 52205560oung Elite Scientists Sponsorship Program by CAST 2022QNRC001
6 · The paper itself

Abstract

contextCu/Zr multilayers have important applications in high-strength structural materials, wear-resistant coatings, and microelectronic devices. This study presents a molecular dynamics model to simulate the diamond scratching process of Cu/Zr multilayers, examining the effects of parameters such as scratching speed and depth on this process. The simulations were conducted at different scratching speeds and scratching depths. The results indicate that scratching speed significantly influences the location of chip formation on the surface of the Cu/Zr multilayers. Moreover, increasing scratching depth results in larger chip volumes and higher scratching forces. This study enhances our understanding of how scratching parameters influence the behavior of Cu/Zr multilayers, providing valuable insights for their applications.

methodsIn this study, Large-scale Atomic/Molecular Massively Parallel Simulator (LAMMPS) is used to simulate the entire scratching process, and EAM potential function is used to describe the interaction forces between atoms during the scratching process. After the simulation is completed, use the open visualization software OVITO to process the simulation results and obtain images.

Indexed as

Cu/ZrMolecular dynamicsMultilayersNano-scratching

Identifiers

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.