Evidence map›Paper›PMID 41698936›Full record

ArticleNature communications2026

van der Waals dielectrics for threshold engineering in two-dimensional field effect transistors.

Dipanjan Sen, Harikrishnan Ravichandran, Safdar Imam, Subir Ghosh, Krishnendu Mukhopadhyay, Md Yasir Bashir, Thomas S Ie, Vlastimil Mazanek, Jan Luxa, Chen Chen and 5 more

Abstract read
PubMed Full text at PMC Publisher
In one paragraph

Article in Nature communications, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

15 authors.

Dipanjan SenEngineering Science and Mechanics, Penn State University, University Park, PA, USA.
Harikrishnan RavichandranEngineering Science and Mechanics, Penn State University, University Park, PA, USA.ORCID http://orcid.org/0009-0002-2230-370X
Safdar ImamDepartment of Chemistry, Northwestern University, Evanston, IL, USA.ORCID http://orcid.org/0009-0003-1773-5177
Subir GhoshEngineering Science and Mechanics, Penn State University, University Park, PA, USA.ORCID http://orcid.org/0000-0002-0883-4478
Krishnendu MukhopadhyayEngineering Science and Mechanics, Penn State University, University Park, PA, USA.
Md Yasir BashirElectrical Engineering, Indian Institute of Technology, Kanpur, Uttar Pradesh, India.ORCID http://orcid.org/0000-0001-5870-2134
Thomas S IeDepartment of Chemistry, Northwestern University, Evanston, IL, USA.ORCID http://orcid.org/0009-0003-2775-5905
Vlastimil MazanekDepartment of Inorganic Chemistry, University of Chemistry and Technology Prague, Prague, Czech Republic.
Jan LuxaDepartment of Inorganic Chemistry, University of Chemistry and Technology Prague, Prague, Czech Republic.
Chen Chen2D Crystal Consortium Materials Innovation Platform, Penn State University, University Park, PA, USA.ORCID http://orcid.org/0000-0001-9027-7107
Joan M Redwing2D Crystal Consortium Materials Innovation Platform, Penn State University, University Park, PA, USA.ORCID http://orcid.org/0000-0002-7906-452X
Zdenek SoferDepartment of Inorganic Chemistry, University of Chemistry and Technology Prague, Prague, Czech Republic.
Shubham SahayElectrical Engineering, Indian Institute of Technology, Kanpur, Uttar Pradesh, India.ORCID http://orcid.org/0000-0001-9992-3240
Mercouri G KanatzidisDepartment of Chemistry, Northwestern University, Evanston, IL, USA.ORCID http://orcid.org/0000-0003-2037-4168
Saptarshi DasEngineering Science and Mechanics, Penn State University, University Park, PA, USA. sud70@psu.edu.ORCID http://orcid.org/0000-0002-0188-945X

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Two-dimensional (2D) semiconductors are promising for next-generation field-effect transistors (FETs), but their integration into complementary-metal-oxide-semiconductors (CMOS) logic is hindered by improper threshold voltages (

Identifiers

PMID41698936
PMCPMC13022202

What OpenQuestion holds

Textmetadata
LicenceCC BY-NC-ND
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.