A Co-Designed Framework Combining Dome-Aperture Imaging and Generative AI for Defect Detection on Non-Planar Metal Surfaces.

Automated visual inspection of safety-critical metal assemblies such as automotive door lock strikes remains challenging due to their complex three-dimensional geometry, highly reflective surfaces, and scarcity of defect samples. While 3D sensing technologies are often constrained by cost and speed, traditional 2D optical methods struggle with severe imaging artifacts and poor generalization under few-shot conditions. This work constructs a complete system integrating defect imaging, generation, and detection. It proposes an integrated framework through the co-design of an image acquisition system and deep generative models to holistically enhance defect perception capability. First, we develop an imaging system using dome illumination and a small-aperture lens to acquire high-quality images of non-planar metal surfaces. Subsequently, we introduce a dual-stage generation strategy: stage one employs an improved FastGAN with Dynamic Multi-Granularity Fusion Skip-Layer Excitation (DMGF-SLE) and perceptual loss to efficiently generate high-quality local defect patches; stage two utilizes Poisson image editing and an optimized loss function to seamlessly fuse defect patches into specified locations of normal images. This strategy avoids modeling the complete complex background, concentrating computational resources on creating realistic defects. Experiments on a dedicated dataset demonstrate that our method can efficiently generate realistic defect samples under few-shot conditions, achieving 11-24% improvement in Fréchet Inception Distance (FID) scores over baseline models. The generated synthetic data significantly enhances downstream detection performance, increasing YOLOv8's mAP@50:95 from 50.4% to 60.5%. Beyond proposing individual technical improvements, this research provides a complete, synergistic, and deployable system solution-from physical imaging to algorithmic generation-delivering a computationally efficient and practically viable technical pathway for defect detection in highly reflective, non-planar metal components.