Evidence map›Paper›PMID 41682296›Full record

ArticleSensors (Basel, Switzerland)2026

Silicon Nanowire-Based Schottky Diodes for Enhanced Temperature Sensing and Extended Operable Range.

Gheorghe Pristavu, Razvan Pascu, Melania Popescu, Monica Simion, Cosmin Romanitan, Iuliana Mihalache, Florin Draghici, Gheorghe Brezeanu

Abstract read
In one paragraph

Article in Sensors (Basel, Switzerland), 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

8 authors.

Gheorghe PristavuFaculty of Electronics, Telecommunications and Information Technology, National University of Science and Technology Politehnica Bucharest, 060042 Bucharest, Romania.ORCID 0000-0003-4997-0510
Razvan PascuNational Institute for Research and Development in Microtechnologies-IMT Bucharest, 077190 Bucharest, Romania.ORCID 0000-0003-3170-9752
Melania PopescuNational Institute for Research and Development in Microtechnologies-IMT Bucharest, 077190 Bucharest, Romania.
Monica SimionNational Institute for Research and Development in Microtechnologies-IMT Bucharest, 077190 Bucharest, Romania.
Cosmin RomanitanNational Institute for Research and Development in Microtechnologies-IMT Bucharest, 077190 Bucharest, Romania.ORCID 0000-0002-5615-6624
Iuliana MihalacheNational Institute for Research and Development in Microtechnologies-IMT Bucharest, 077190 Bucharest, Romania.ORCID 0000-0002-4417-4972
Florin DraghiciFaculty of Electronics, Telecommunications and Information Technology, National University of Science and Technology Politehnica Bucharest, 060042 Bucharest, Romania.
Gheorghe BrezeanuFaculty of Electronics, Telecommunications and Information Technology, National University of Science and Technology Politehnica Bucharest, 060042 Bucharest, Romania.

Funding

Unitatea Executiva Pentru Finantarea Invatamantului Superior a Cercetarii Dezvoltarii si Inovarii PN-IV-P2-2.1- TE-2023-1740Unitatea Executiva Pentru Finantarea Invatamantului Superior a Cercetarii Dezvoltarii si Inovarii PN-IV-P7-7.1-PED-2024-1060Unitatea Executiva Pentru Finantarea Invatamantului Superior a Cercetarii Dezvoltarii si Inovarii PN-IV-P7-7.1-PED-2024-1629Unitatea Executiva Pentru Finantarea Invatamantului Superior a Cercetarii Dezvoltarii si Inovarii PN-IV-P7-7.1-PED-2024-2521
6 · The paper itself

Abstract

This paper analyzes microstructural layout and electrical behavior of silicon nanowire-based Schottky diodes, for use as wide-domain temperature sensors. The employed nanostructured three-dimensional substrates provide larger contact areas and enable higher Schottky barrier heights, ultimately leading to a better operable temperature range. Two metal deposition techniques (Radio Frequency sputtering and Electron-beam evaporation) are used to fabricate experimental Schottky diode samples. Scanning electron microscopy, X-ray diffraction, and diffuse reflectance investigations are carried out in order to determine nanowire distribution and the influence of subsequent metal deposition. The analyses evince the formation of a slightly inhomogeneous contact. The findings are validated by a thorough electrical characterization over a wide temperature domain. Inhomogeneity models are used in order to determine the main device parameters and the bias regions where they can be used as precise temperature sensors. The sputtered sample exhibits the best sensitivity, between 1 and 1.4 mV/K, while excellent linearity (R

Indexed as

contact inhomogeneitySchottky diodesilicon nanowirestemperature sensor

Identifiers

PMID41682296
PMCPMC12899260

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.