Evidence map›Paper›PMID 41682125›Full record

ArticlePolymers2026

An Investigation of the Electrical Performance of Polymer-Based Stretchable TFTs Under Mechanical Strain Using the Y-Function Method.

Hyunjong Lee, Hyunbum Kang, Chanho Jeong, Insung Choi, Sohee Kim, Eunki Baek, JongKwon Lee, Dongwook Kim, Jaehoon Park, Gae Hwang Lee and 1 more

Abstract read
In one paragraph

Article in Polymers, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
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1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

11 authors.

Hyunjong LeeSchool of Semiconductor·Display Technology, Hallym University, Chuncheon 24252, Republic of Korea.ORCID 0009-0005-2893-351X
Hyunbum KangDepartment of Chemistry, University of Ulsan, Ulsan 44776, Republic of Korea.
Chanho JeongSchool of Semiconductor·Display Technology, Hallym University, Chuncheon 24252, Republic of Korea.
Insung ChoiSchool of Semiconductor·Display Technology, Hallym University, Chuncheon 24252, Republic of Korea.ORCID 0009-0006-3484-5628
Sohee KimSchool of Semiconductor·Display Technology, Hallym University, Chuncheon 24252, Republic of Korea.ORCID 0009-0005-6208-3280
Eunki BaekSchool of Semiconductor·Display Technology, Hallym University, Chuncheon 24252, Republic of Korea.ORCID 0009-0009-0425-8985
JongKwon LeeSchool of Semiconductor·Display Technology, Hallym University, Chuncheon 24252, Republic of Korea.
Dongwook KimSchool of Semiconductor·Display Technology, Hallym University, Chuncheon 24252, Republic of Korea.
Jaehoon ParkSchool of Semiconductor·Display Technology, Hallym University, Chuncheon 24252, Republic of Korea.
Gae Hwang LeeSamsung Advanced Institute of Technology (SAIT), Samsung Electronics, Suwon 16678, Republic of Korea.ORCID 0000-0002-4521-8957
Youngjun YunSchool of Semiconductor·Display Technology, Hallym University, Chuncheon 24252, Republic of Korea.ORCID 0000-0002-3639-9741

Funding

Korea government (MSIT) RS-2022-NR070859Ministry of Education (MOE) and the Gangwon State (G.S.), Republic of Korea 2025-RISE-10-009, 2025-RISE-10-006
6 · The paper itself

Abstract

Stretchable semiconductors capable of maintaining electrical performance under large mechanical deformation are essential for reliable wearable electronic devices. However, polymer semiconductors often suffer from electrical degradation when subjected to tensile strain. In this study, electrical stability under strain was achieved by using a rubber-blended poly(2,5-bis(2-octyldodecyl)-3,6-di(thiophen-2-yl)diketopyrrolo[3,4-c]pyrrole-1,4-dione-alt-thieno[3,2-b]thiophene) (DPPT-TT) polymer semiconductor based on a conjugated polymer/elastomer phase separation-induced elasticity (CONPHINE) structure. Unlike most previous studies on fully stretchable thin-film transistors (TFTs), which primarily report overall performance changes under mechanical strain, this work systematically identifies the dominant origin of electrical performance degradation through a stepwise electrical analysis encompassing the gate insulating layer, the semiconductor layer, and complete devices. Bottom-gate top-contact (BGTC) and bottom-gate bottom-contact (BGBC) devices were fabricated on rigid Si/SiO

Indexed as

organic thin-film transistors (OTFTs)stretchable transistorsY-function method

Identifiers

PMID41682125
PMCPMC12899371

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.