Aluminum-Induced Surface-Enhanced Raman Scattering in Ti-Al-Ti Sandwich Multilayer Thin Films.

Luping Wu, Tingzhen Yan, Ruijin Hong, Chunxian Tao, Qi Wang, Hui Lin, Zhaoxia Han

Abstract read

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Article in Nanomaterials (Basel, Switzerland), 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

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1 citing paper in PubMed.

A Predictive Strength Model for Cu/Ni Nanolayered Composites with FCC Interfacial Layers Under Loading Parallel to the Interface.Nanomaterials (Basel, Switzerland) · 2026
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7 authors.

Luping WuEngineering Research Center of Optical Instrument and System, Ministry of Education and Shanghai Key Lab of Modern Optical System, University of Shanghai for Science and Technology, No. 516 Jungong Road, Shanghai 200093, China.

Tingzhen YanEngineering Research Center of Optical Instrument and System, Ministry of Education and Shanghai Key Lab of Modern Optical System, University of Shanghai for Science and Technology, No. 516 Jungong Road, Shanghai 200093, China.

Ruijin HongEngineering Research Center of Optical Instrument and System, Ministry of Education and Shanghai Key Lab of Modern Optical System, University of Shanghai for Science and Technology, No. 516 Jungong Road, Shanghai 200093, China.

Chunxian TaoEngineering Research Center of Optical Instrument and System, Ministry of Education and Shanghai Key Lab of Modern Optical System, University of Shanghai for Science and Technology, No. 516 Jungong Road, Shanghai 200093, China.

Qi WangEngineering Research Center of Optical Instrument and System, Ministry of Education and Shanghai Key Lab of Modern Optical System, University of Shanghai for Science and Technology, No. 516 Jungong Road, Shanghai 200093, China.

Hui LinEngineering Research Center of Optical Instrument and System, Ministry of Education and Shanghai Key Lab of Modern Optical System, University of Shanghai for Science and Technology, No. 516 Jungong Road, Shanghai 200093, China.

Zhaoxia HanEngineering Research Center of Optical Instrument and System, Ministry of Education and Shanghai Key Lab of Modern Optical System, University of Shanghai for Science and Technology, No. 516 Jungong Road, Shanghai 200093, China.ORCID 0000-0002-4463-5601

Funding

"Chenguang Program" of Shanghai Education Development Foundation and Shanghai Municipal Education Commission 23CGB10High-Level Talent Start Fund Project of Shanghai Publishing and Printing College 2025RCKY01National Natural Science Foundation of China 62275159National Natural Science Foundation of China 62505179

6 · The paper itself

Abstract

A series of Ti-Al-Ti sandwich thin films with different Al layer thicknesses was prepared via magnetron sputtering. The Al layer facilitated Ti-Al metal coupling within the films, which significantly strengthened the localized surface plasmon resonance (LSPR) and obtained more "hot-spots", ultimately leading to a remarkable enhancement of the localized electric field. The LSPR effectively promoted charge transfer between probe molecules and the Ti-Al-Ti sandwich thin film. Raman scattering intensity was jointly governed by chemical and electromagnetic enhancement mechanisms. When used as a surface-enhanced Raman scattering (SERS) substrate for methylene blue (MB) detection, the sandwich-structured films achieved a Raman enhancement factor of 3.27 × 10

Indexed as

optical thin filmssandwich structuresurface-enhanced Raman scatteringtitanium aluminum multilayer films

Identifiers

PMID41677565

DOI10.3390/nano16030216

PMCPMC12899439

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