Evidence map›Paper›PMID 41677506›Full record

ArticleNanomaterials (Basel, Switzerland)2026

Defect Characterization of the SiO

Ricardo Helm, Werner Egger, Catherine Corbel, Peter Sperr, Maik Butterling, Andreas Wagner, Maciej Oskar Liedke, Eric Hirschmann, Johannes Mitteneder, Michael Mayerhofer and 4 more

Abstract read
PubMed Full text at PMC Publisher
In one paragraph

Article in Nanomaterials (Basel, Switzerland), 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

14 authors.

Ricardo HelmInstitute for Applied Physics and Measurement Technology, University of the Bundeswehr Munich, 85579 Munich, Germany.ORCID 0009-0003-2048-0144
Werner EggerInstitute for Applied Physics and Measurement Technology, University of the Bundeswehr Munich, 85579 Munich, Germany.ORCID 0000-0001-6276-1305
Catherine CorbelLSI, CEA/DRF/IRAMIS, CNRS, Ecole Polytechnique, Institut Polytechnique de Paris, 91120 Palaiseau, France.
Peter SperrInstitute for Applied Physics and Measurement Technology, University of the Bundeswehr Munich, 85579 Munich, Germany.
Maik ButterlingReactor Institute Delft, Delft University of Technology, 2629 JB Delft, The Netherlands.ORCID 0000-0003-3674-0767
Andreas WagnerInstitute of Radiation Physics, Helmholtz Center Dresden-Rossendorf, 01328 Dresden, Germany.ORCID 0000-0001-7575-3961
Maciej Oskar LiedkeInstitute of Radiation Physics, Helmholtz Center Dresden-Rossendorf, 01328 Dresden, Germany.ORCID 0000-0001-7933-7295
Eric HirschmannInstitute of Radiation Physics, Helmholtz Center Dresden-Rossendorf, 01328 Dresden, Germany.ORCID 0000-0001-5782-9627
Johannes MittenederInstitute for Applied Physics and Measurement Technology, University of the Bundeswehr Munich, 85579 Munich, Germany.ORCID 0009-0008-4374-7848
Michael MayerhoferInstitute for Applied Physics and Measurement Technology, University of the Bundeswehr Munich, 85579 Munich, Germany.ORCID 0000-0002-1433-1885
Kangho LeeInstitute of Physics, University of the Bundeswehr Munich, 85579 Munich, Germany.ORCID 0000-0002-6495-5231
Georg S DuesbergInstitute of Physics, University of the Bundeswehr Munich, 85579 Munich, Germany.
Günther DollingerInstitute for Applied Physics and Measurement Technology, University of the Bundeswehr Munich, 85579 Munich, Germany.
Marcel DickmannInstitute for Applied Physics and Measurement Technology, University of the Bundeswehr Munich, 85579 Munich, Germany.ORCID 0009-0005-8971-7626

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

This study demonstrates drift-assisted positron annihilation lifetime spectroscopy on a p-type (100) silicon substrate in a MOS capacitor, using an applied electric field to control the spatial positron distribution prior to annihilation. The device was operated under accumulation, depletion, and inversion conditions, revealing that the internal electric field can drift-transport positrons either toward or away from the SiO

Indexed as

drift-assisted positron annihilation lifetime spectroscopyinterface defectsoxide–semiconductor interfaceultra thin-films

Identifiers

PMID41677506
PMCPMC12899358

What OpenQuestion holds

Textmetadata
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Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.