Evidence map›Paper›PMID 41667431›Full record

ArticleMicrosystems & nanoengineering2026

Machine learning based real-time assessment of fabrication deviation induced mechanical performance variations in stretchable silicon arrays.

Bo Wen, Han Xu, Yikang Ding, Qi Wang, Pan Zhang, Chi Zhang, Wei Wang

Abstract read
In one paragraph

Article in Microsystems & nanoengineering, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

7 authors.

Bo Wen *School of Integrated Circuits, Peking University, Beijing, China.
Han Xu *School of Integrated Circuits, Peking University, Beijing, China. h.xu@pku.edu.cn.
Yikang DingPeking University Shenzhen Graduate School, Peking University, Shenzhen, China.
Qi WangPeking University Shenzhen Graduate School, Peking University, Shenzhen, China.
Pan ZhangSchool of Integrated Circuits, Peking University, Beijing, China.ORCID http://orcid.org/0000-0001-9130-5982
Chi ZhangSchool of Integrated Circuits, Peking University, Beijing, China.
Wei WangSchool of Integrated Circuits, Peking University, Beijing, China. w.wang@pku.edu.cn.ORCID http://orcid.org/0000-0002-5257-7675

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Microelectromechanical system fabrication represents a promising approach for silicon-based flexible electronics, leveraging its scalability and miniaturization merits. However, fabrication-induced geometric deviations stretchable microstructures can result in significant variations in mechanical performances. Current assessment methods lack sufficient accuracy for these precision-sensitive manufacturing processes. This work proposes a machine-learning (ML)-based assessment methodology for accurately and rapidly predicting the mechanical performances, including equivalent Young's modulus and the maximum elastic stretchability, of Parylene three-dimensional micro-Kirigami stretchable structures in a stretchable silicon array affected by the fabrication-induced geometric deviations. By applying the dimensionality reduction technique specifically designed for few-shot ML modeling, the framework achieves prediction accuracies exceeding 95% on the test set. SHapley Additive exPlanations (SHAP) analysis is further utilized to quantify the impact of various geometric features on mechanical performances. This ML-based assessment methodology successfully facilitates real-time feedback from process-induced geometric deviations to the qualification probability of mechanical performances. This proposed approach supports design-for-manufacturability (DFM) of silicon-based stretchable arrayed devices manufacturing and lays the foundation for high-consistency wafer-scale manufacturing of high-performance stretchable silicon electronics.

Identifiers

PMID41667431
PMCPMC12891560

What OpenQuestion holds

Textmetadata
LicenceCC BY-NC-ND
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.