Evidence map›Paper›PMID 41655228›Full record

ArticleAdvanced science (Weinheim, Baden-Wurttemberg, Germany)2026

Noise Fingerprints as a Quantitative Order Parameter for Polarization- and Defect-Mediated Switching in Hafnia Ferroelectrics.

Ryun-Han Koo, Jiseong Im, Joon Hwang, Sung-Ho Park, Jonghyun Ko, Kangwook Choi, Sangwoo Ryu, Gyuweon Jung, Jong-Ho Lee

Abstract read
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In one paragraph

Article in Advanced science (Weinheim, Baden-Wurttemberg, Germany), 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

9 authors.

Ryun-Han KooDepartment of Electrical and Computer Engineering and Inter-University Semiconductor Research Center (ISRC), Seoul National University, Seoul, South Korea.ORCID https://orcid.org/0000-0002-5708-3308
Jiseong ImDepartment of Electrical and Computer Engineering and Inter-University Semiconductor Research Center (ISRC), Seoul National University, Seoul, South Korea.ORCID https://orcid.org/0000-0002-7260-9224
Joon HwangDepartment of Electrical and Computer Engineering and Inter-University Semiconductor Research Center (ISRC), Seoul National University, Seoul, South Korea.
Sung-Ho ParkDepartment of Electrical and Computer Engineering and Inter-University Semiconductor Research Center (ISRC), Seoul National University, Seoul, South Korea.
Jonghyun KoDepartment of Electrical and Computer Engineering and Inter-University Semiconductor Research Center (ISRC), Seoul National University, Seoul, South Korea.
Kangwook ChoiDepartment of Electrical and Computer Engineering and Inter-University Semiconductor Research Center (ISRC), Seoul National University, Seoul, South Korea.
Sangwoo RyuDepartment of Electrical and Computer Engineering and Inter-University Semiconductor Research Center (ISRC), Seoul National University, Seoul, South Korea.
Gyuweon JungDepartment of Electrical and Computer Engineering and Inter-University Semiconductor Research Center (ISRC), Seoul National University, Seoul, South Korea.ORCID https://orcid.org/0000-0003-0357-0933
Jong-Ho LeeDepartment of Electrical and Computer Engineering and Inter-University Semiconductor Research Center (ISRC), Seoul National University, Seoul, South Korea.ORCID https://orcid.org/0000-0003-3559-9802

Funding

BK21 FOUR program of the Education and Research Program for Future ICT Pioneers, Seoul National UniversityNational Research Foundation of Korea(NRF) RS-2025-00517999
6 · The paper itself

Abstract

Noise, often regarded as an unwanted background in electronic devices, can instead serve as a sensitive probe of switching dynamics. In hafnia ferroelectrics, the coexistence of polarization-mediated (P-RS) and defect-mediated (D-RS) resistance switching has been widely debated, yet prior evidence has remained qualitative. Here, we demonstrate that low-frequency noise (LFN) can be transformed into a quantitative order parameter that disentangles the two mechanisms across program bias (V

Indexed as

defect‐mediated switchinghafnia ferroelectricslow‐frequency noisenoise fingerprintsnoise spectroscopypolarization‐mediated switching

Identifiers

PMID41655228
PMCPMC13073307

What OpenQuestion holds

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Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.