← Evidence map

ArticleMicrosystems & nanoengineering2026

Long-term high-temperature aging mechanism of copper-metallized through-glass vias: a combined nanoindentation test and hybrid Potts-phase field simulation study.

Junwei Chen et al.PubMed ↗Full text ↗Publisher ↗

No numbers read from the abstract.

1 paper cites it

2026
this papercites it
Full record →Abstract, authors, funding and every citing paper · PMID 41622243