Evidence map›Paper›PMID 41615402›Full record

ArticleACS applied materials & interfaces2026

Wafer-Bonded AlGaInP Red LEDs with Suppressed S-Droop through Surface Sulfidation.

Je-Sung Lee, Seung-Hyun Mun, Sunwoo Shin, Rae-Young Kim, Seung Hyeok Lee, Sugyeong Cha, Hye-Sung Han, Kyung-Pil Kim, Hoe-Min Kwak, Jaeyoung Baik and 7 more

Abstract read
In one paragraph

Article in ACS applied materials & interfaces, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

17 authors.

Je-Sung LeeDepartment of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology (GIST), 123 Cheomdangwagi-ro, Buk-gu, Gwangju 61005, Republic of Korea.ORCID 0009-0000-7773-6946
Seung-Hyun MunDepartment of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology (GIST), 123 Cheomdangwagi-ro, Buk-gu, Gwangju 61005, Republic of Korea.
Sunwoo ShinDepartment of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology (GIST), 123 Cheomdangwagi-ro, Buk-gu, Gwangju 61005, Republic of Korea.
Rae-Young KimDepartment of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology (GIST), 123 Cheomdangwagi-ro, Buk-gu, Gwangju 61005, Republic of Korea.
Seung Hyeok LeeDepartment of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology (GIST), 123 Cheomdangwagi-ro, Buk-gu, Gwangju 61005, Republic of Korea.
Sugyeong ChaDepartment of Semiconductor Engineering, Gwangju Institute of Science and Technology (GIST), 123 Cheomdangwagi-ro, Buk-gu, Gwangju 61005, Republic of Korea.
Hye-Sung HanDepartment of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology (GIST), 123 Cheomdangwagi-ro, Buk-gu, Gwangju 61005, Republic of Korea.
Kyung-Pil KimDepartment of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology (GIST), 123 Cheomdangwagi-ro, Buk-gu, Gwangju 61005, Republic of Korea.
Hoe-Min KwakDepartment of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology (GIST), 123 Cheomdangwagi-ro, Buk-gu, Gwangju 61005, Republic of Korea.ORCID 0009-0004-3134-8664
Jaeyoung BaikDepartment of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology (GIST), 123 Cheomdangwagi-ro, Buk-gu, Gwangju 61005, Republic of Korea.
Soo-Young ChoiDepartment of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology (GIST), 123 Cheomdangwagi-ro, Buk-gu, Gwangju 61005, Republic of Korea.
Sang-Jo KimSamsung Display Co. Ltd., 1 Samsung-ro, Giheung-gu, Yongin-si, Gyeonggi-do 17113, Republic of Korea.
Woo-Lim JeongSamsung Display Co. Ltd., 1 Samsung-ro, Giheung-gu, Yongin-si, Gyeonggi-do 17113, Republic of Korea.
Jun-Youn KimSamsung Display Co. Ltd., 1 Samsung-ro, Giheung-gu, Yongin-si, Gyeonggi-do 17113, Republic of Korea.
Sung-Chan JoSamsung Display Co. Ltd., 1 Samsung-ro, Giheung-gu, Yongin-si, Gyeonggi-do 17113, Republic of Korea.
Chang-Mo KangDepartment of Nanomechatronics Engineering, Pusan National University, Geumjeong gu,Busan 46241, Republic of Korea.ORCID 0000-0003-0060-2434
Dong-Seon LeeDepartment of Electrical Engineering and Computer Science, Gwangju Institute of Science and Technology (GIST), 123 Cheomdangwagi-ro, Buk-gu, Gwangju 61005, Republic of Korea.ORCID 0000-0003-2706-8702

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Micro-light-emitting diode (micro-LED) technology enables high pixels-per-inch (PPI) displays using conventional semiconductor processes and relies on extremely miniaturized mesa structures derived from traditional LEDs. Scaling to smaller sizes leads to a significant decrease in emission efficiency because of the stronger influence of sidewall damage. This efficiency degradation, known as the size-effect or S-droop, primarily arises from surface defects introduced by dry etching. These defects promote nonradiative Shockley-Read-Hall (SRH) recombination and create pathways for surface leakage current. In aluminum gallium indium phosphide (AlGaInP) LEDs, chemical passivation with ammonium sulfide is widely used to mitigate sidewall damage. However, the underlying reaction mechanism remains unclear, and most studies address only the sidewall regions. In this work, we fabricated a wafer-bonded vertical AlGaInP LED structure compatible with light-emitting diode on silicon (LEDoS) integration and applied ammonium sulfide surface sulfidation to investigate its broader effects. Chemical changes from sulfidation were examined using energy dispersive spectroscopy (EDS) and X-ray photoelectron spectroscopy (XPS). These analyses revealed that surface defects were replaced by stable sulfur bridge bonds, leading to Fermi level unpinning. Electrical characterization further separated parallel and series resistances, which revealed the influence of surface sulfidation across both the top and sidewall interfaces. As a result, the maximum external quantum efficiency (EQE) increased by 120.6% at 5 A/cm

Indexed as

AlGaInPammonium sulfideLEDoSmicro LEDpassivationred LEDS-droopsize-effect

Identifiers

PMID41615402
PMCPMC12903108

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.