ArticleSensors (Basel, Switzerland)2026
High-Resolution Spatiotemporal-Coded Differential Eddy-Current Array Probe for Defect Detection in Metal Substrates.
Article in Sensors (Basel, Switzerland), 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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Abstract
To address the problems of weak geometric features, low signal response amplitude, and insufficient spatial resolvability of near-surface defects in metal substrates, a high-resolution spatiotemporal-coded eddy-current array probe is proposed. The probe adopts an array topology with time-multiplexed excitation and adjacent differential reception, achieving a balance between high common-mode rejection ratio and high-density spatial sampling. First, a theoretical electromagnetic coupling model between the probe and the metal substrate is established, and finite-element simulations are conducted to investigate the evolution of the skin effect, eddy-current density distribution, and differential impedance response over an excitation frequency range of 1-10 MHz. Subsequently, a 64-channel M-DECA probe and an experimental testing platform are developed, and frequency-sweeping experiments are carried out under different excitation conditions. Experimental results indicate that, under a 50 kHz excitation frequency, the array eddy-current response achieves an optimal trade-off between signal amplitude and spatial geometric consistency. Furthermore, based on the pixel-to-physical coordinate mapping relationship, the lateral equivalent diameters of near-surface defects with different characteristic scales are quantitatively characterized, with relative errors of 6.35%, 4.29%, 3.98%, 3.50%, and 5.80%, respectively. Regression-based quantitative analysis reveals a power-law relationship between defect area and the amplitude of the differential eddy-current array response, with a coefficient of determination R2=0.9034 for the bipolar peak-to-peak feature. The proposed M-DECA probe enables high-resolution imaging and quantitative characterization of near-surface defects in metal substrates, providing an effective solution for electromagnetic detection of near-surface, low-contrast defects.
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