ArticleJournal of applied crystallography2025
Quantifying interflake ordering in graphene oxide films via wide-angle X-ray scattering analysis.
Article in Journal of applied crystallography, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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Abstract
We report a methodology based on wide-angle X-ray scattering (WAXS) to quantify the ordering between graphene oxide (GO) flakes in self-assembled films. By comparing WAXS signals of GO and graphite, we extract orientation distribution coefficients (
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