Evidence map›Paper›PMID 41514484›Full record

ArticleNano letters2026

Enhanced Secondary-Electron Detection of Single-Ion Implants in Silicon through Thin SiO

E B Schneider, O G Lloyd-Willard, K Stockbridge, M Ludlow, S Eserin, L Antwis, D C Cox, R P Webb, B N Murdin, S K Clowes

Abstract read
PubMed Full text at PMC Publisher
In one paragraph

Article in Nano letters, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

10 authors.

E B SchneiderSurrey Ion Beam Centre, School of Computer Science and Electronic Engineering, University of Surrey, Guildford GU2 7XH, U.K.ORCID 0000-0002-7897-9824
O G Lloyd-WillardSchool of Maths and Physics, University of Surrey, Guildford GU2 7XH, U.K.
K StockbridgeIonoptika Ltd., Unit B6, Millbrook Cl, Chandler's Ford, Eastleigh SO53 4BZ, U.K.
M LudlowSurrey Ion Beam Centre, School of Computer Science and Electronic Engineering, University of Surrey, Guildford GU2 7XH, U.K.
S EserinSchool of Maths and Physics, University of Surrey, Guildford GU2 7XH, U.K.ORCID 0009-0000-8860-886X
L AntwisSurrey Ion Beam Centre, School of Computer Science and Electronic Engineering, University of Surrey, Guildford GU2 7XH, U.K.ORCID 0000-0003-4415-4784
D C CoxSurrey Ion Beam Centre, School of Computer Science and Electronic Engineering, University of Surrey, Guildford GU2 7XH, U.K.
R P WebbSurrey Ion Beam Centre, School of Computer Science and Electronic Engineering, University of Surrey, Guildford GU2 7XH, U.K.
B N MurdinSchool of Maths and Physics, University of Surrey, Guildford GU2 7XH, U.K.ORCID 0000-0001-9219-652X
S K ClowesSurrey Ion Beam Centre, School of Computer Science and Electronic Engineering, University of Surrey, Guildford GU2 7XH, U.K.

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Deterministic placement of single dopants is essential for scalable quantum devices based on Group V donors in silicon. We demonstrate a nondestructive, high-efficiency method for detecting individual ion implantation events using secondary electrons (SEs) in a focused-ion-beam system. Using low-energy Sb ions implanted into undoped silicon, we achieve up to 98 ± 1% single-ion detection efficiency (DE). We find that introducing thin, controlled SiO

Indexed as

focused ion beamsnanofabricationquantum technologiessingle-ion detectionsingle-ion implantation

Identifiers

PMID41514484
PMCPMC12833841

What OpenQuestion holds

Textmetadata
LicenceCC BY
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Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.