ArticleiScience2025
Integrated transmission-reflection strong-field terahertz time-domain spectroscopy.
Article in iScience, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. An erratum has been issued. Not yet cited in PubMed.
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Corrections and comments
- Erratum issued
Authors and funding
11 authors.
Funding
No grant is acknowledged in the PubMed record.
Abstract
Strong-field terahertz time-domain spectroscopy (THz-TDS) is an effective tool for material testing, non-destructive testing, and modulation device measurement. Strong-field THz waves advance non-equilibrium perturbation, quantum material manipulation, and biomedical research, but their systems are long constrained by strong-field THz sources' performance limits and high costs. Here, we present a high-repetition-rate integrated transmission-reflection strong-field THz-TDS, driven by an industrial Yb-doped femtosecond laser (1,030 nm, 0.8 mJ, 570 fs, 1-50 kHz tunable repetition rate). It achieves 1.14 μJ single-pulse THz energy (>403 kV/cm focal peak field), 43 mW average power (50 kHz), and ∼60 dB signal-to-noise ratio (SNR) for both modes. Verified by high-resistivity silicon wafer thickness profiling and THz field-sensitive metasurface testing (100 GHz frequency shift under THz field change), it enables nonlinear excitation and strong-field spectroscopy. Compared to Ti:sapphire-driven systems, it has comparable THz field at a lower cost, higher power, and faster measurement potential, promising broader practical applications.
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