Evidence map›Paper›PMID 41470484›Full record

ArticleMicromachines2025

An Improved Nonlinear Capacitance Model for GaN HEMTs Based on the Angelov Model.

Yuchen Miao, Qingyu Yuan, Chuangye Wang, Jiali Cheng

Abstract read
In one paragraph

Article in Micromachines, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

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0citing papers in PubMed
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1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

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3 · Its place in the literature

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0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

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5 · Who and what money

Authors and funding

4 authors.

Yuchen MiaoSchool of Electronic Engineering, Jiangsu Ocean University, Lianyungang 222005, China.ORCID 0009-0004-7700-7961
Qingyu YuanZhejiang Provincial Key Laboratory of Spatial Information Perception and Transmission, Institute of Spatial Information, Hangzhou Dianzi University, Hangzhou 310018, China.
Chuangye WangSchool of Electronic Engineering, Jiangsu Ocean University, Lianyungang 222005, China.
Jiali ChengSchool of Electronic Engineering, Jiangsu Ocean University, Lianyungang 222005, China.ORCID 0000-0002-0349-534X

Funding

the Open Research Program of Zhejiang Key Laboratory of Information and Energy Integrated Microsystem 2024ZY01014
6 · The paper itself

Abstract

To accurately model the nonlinear characteristics of the intrinsic capacitance of Gallium Nitride High Electron Mobility Transistors (GaN HEMTs), this paper proposes an improved nonlinear capacitance model based on the traditional Angelov model. The experiments employed GaN HEMTs fabricated by United Monolithic Semiconductors (UMS) using the GH15-10 process. These devices feature a uniform gate length of 150 nm, with gate widths designed as 2 × 10 μm, 4 × 20 μm, 6 × 30 μm, and 8 × 40 μm, respectively (gate width is calculated as "number of gate fingers × unit gate width"). In this study, two types of devices with gate widths of 2 × 10 μm and 4 × 20 μm were selected to extract intrinsic capacitance parameters, which were then substituted into the traditional Angelov model and the proposed improved model, respectively. By comparing the coefficient of determination (R

Indexed as

Angelov modintrinsic capacitancenonlinear capacitanceparameter extractionsmall-signal equivalent circuit

Identifiers

PMID41470484
PMCPMC12734474

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.