Evidence map›Paper›PMID 41438677›Full record

ArticleNational science review2025

A field-programmable gate array based on wafer-scale 2D semiconductor.

Qicheng Sun, Mingrui Ao, Xiangqi Dong, Kaichuang Shi, Saifei Gou, Yuxuan Zhu, Zhejia Zhang, Jinshu Zhang, Yan Hu, Zhengjie Sun and 4 more

Abstract read
In one paragraph

Article in National science review, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

14 authors.

Qicheng SunState Key Laboratory of Integrated Chips and Systems, College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai 200433, China.
Mingrui AoState Key Laboratory of Integrated Chips and Systems, College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai 200433, China.
Xiangqi DongState Key Laboratory of Integrated Chips and Systems, College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai 200433, China.
Kaichuang ShiState Key Laboratory of Integrated Chips and Systems, College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai 200433, China.
Saifei GouState Key Laboratory of Integrated Chips and Systems, College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai 200433, China.
Yuxuan ZhuState Key Laboratory of Integrated Chips and Systems, College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai 200433, China.
Zhejia ZhangState Key Laboratory of Integrated Chips and Systems, College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai 200433, China.
Jinshu ZhangState Key Laboratory of Integrated Chips and Systems, College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai 200433, China.
Yan HuState Key Laboratory of Integrated Chips and Systems, College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai 200433, China.
Zhengjie SunState Key Laboratory of Integrated Chips and Systems, College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai 200433, China.
Xinyu ChenState Key Laboratory of Integrated Chips and Systems, College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai 200433, China.
Lingli WangState Key Laboratory of Integrated Chips and Systems, College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai 200433, China.
Wenzhong BaoState Key Laboratory of Integrated Chips and Systems, College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai 200433, China.
Peng ZhouState Key Laboratory of Integrated Chips and Systems, College of Integrated Circuits and Micro-Nano Electronics, Fudan University, Shanghai 200433, China.ORCID https://orcid.org/0000-0002-7301-1013

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

In recent years, 2D transition-metal dichalcogenides (2D-TMDs) have garnered significant attention owing to their unique electronic properties. Particularly in the application of short-channel field-effect transistors, 2D-TMDs have demonstrated notable superiority compared with silicon. This is primarily attributed to their exceptional low off-state current enabled by their monolayer structure, which is crucial for suppressing short-channel effects. Consequently, 2D-TMDs have been widely recognized as promising candidates for future technology. However, current 2D-TMD-based semiconductor devices are predominantly focused on simple logic circuits, lacking practical validation for large-scale functional circuits. In this work, we present a top-gate 2D field-programmable gate array (FPGA) based on the 2D-TMD material molybdenum disulfide. This circuit marks the first demonstration of an FPGA that was constructed from 2D-TMDs, comprising ∼4000 field effect transistors (FETs) and programmable. In addition, our circuits demonstrate unique advantages in irradiation resistance. Our work provides a significant impetus for the further development of 2D-TMD technology towards practical applications.

Indexed as

2D materialfield-programmable gate arrayintegrated circuitirradiation resistance

Identifiers

PMID41438677
PMCPMC12721377

What OpenQuestion holds

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LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.