ArticleNanophotonics (Berlin, Germany)2025
AI-based analysis algorithm incorporating nanoscale structural variations and measurement-angle misalignment in spectroscopic ellipsometry.
Article in Nanophotonics (Berlin, Germany), 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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Abstract
Spectroscopic ellipsometry (SE) is a powerful, non-destructive technique for nanoscale structural characterization. However, conventional SE data analysis typically assumes perfectly periodic specimen structures, overlooking fabrication-induced structural variations and thereby reducing the accuracy of predicted structural parameters. We have developed an enhanced analysis framework that explicitly accounts for both nanoscale structural variations and measurement-angle misalignment by introducing the concept of an average Mueller matrix (MM), which represents statistical distributions of nanoscale structures. In addition, we introduce a high-throughput MM-generation neural network that enables rapid data preparation by approximating rigorous coupled-wave analysis (RCWA) simulations for large numbers of specimens across a broad range of structural parameters. The model achieves a mean-squared error of 9.99 × 10
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