Evidence map›Paper›PMID 41409012›Full record

ReviewAdvanced materials (Deerfield Beach, Fla.)2026

Ferroelectric Transistors: from Materials Innovation to Intelligent Electronic Systems.

Enlong Li, Wunan Wang, Yu Liu, Ruixue Wang, Chunlai Luo, Hongmiao Zhou, Shuo Chen, Shuxin Chen, Zhaoren Xie, Kaichen Zhu and 2 more

Abstract readReview
In one paragraph

Review in Advanced materials (Deerfield Beach, Fla.), 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.

0numbers the graph read from it
0cells of the map it votes in
3citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

3 citing papers in PubMed.

  1. Article
  2. Article
  3. Ferroelectric Devices for In-Memory and In-Sensor Computing.Advanced science (Weinheim, Baden-Wurttemberg, Germany) · 2026
    Review
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

12 authors.

Enlong LiShanghai Frontiers Science Research Base of Intelligent Optoelectronics and Perception, Institute of Optoelectronics, College of Future Information Technology, Fudan University, Shanghai, 200433, China.
Wunan WangShanghai Frontiers Science Research Base of Intelligent Optoelectronics and Perception, Institute of Optoelectronics, College of Future Information Technology, Fudan University, Shanghai, 200433, China.
Yu LiuShanghai Frontiers Science Research Base of Intelligent Optoelectronics and Perception, Institute of Optoelectronics, College of Future Information Technology, Fudan University, Shanghai, 200433, China.
Ruixue WangShanghai Frontiers Science Research Base of Intelligent Optoelectronics and Perception, Institute of Optoelectronics, College of Future Information Technology, Fudan University, Shanghai, 200433, China.
Chunlai LuoShanghai Frontiers Science Research Base of Intelligent Optoelectronics and Perception, Institute of Optoelectronics, College of Future Information Technology, Fudan University, Shanghai, 200433, China.
Hongmiao ZhouShanghai Frontiers Science Research Base of Intelligent Optoelectronics and Perception, Institute of Optoelectronics, College of Future Information Technology, Fudan University, Shanghai, 200433, China.
Shuo ChenShanghai Frontiers Science Research Base of Intelligent Optoelectronics and Perception, Institute of Optoelectronics, College of Future Information Technology, Fudan University, Shanghai, 200433, China.
Shuxin ChenShanghai Frontiers Science Research Base of Intelligent Optoelectronics and Perception, Institute of Optoelectronics, College of Future Information Technology, Fudan University, Shanghai, 200433, China.
Zhaoren XieShanghai Frontiers Science Research Base of Intelligent Optoelectronics and Perception, Institute of Optoelectronics, College of Future Information Technology, Fudan University, Shanghai, 200433, China.
Kaichen ZhuShanghai Frontiers Science Research Base of Intelligent Optoelectronics and Perception, Institute of Optoelectronics, College of Future Information Technology, Fudan University, Shanghai, 200433, China.
Wenwu LiShanghai Frontiers Science Research Base of Intelligent Optoelectronics and Perception, Institute of Optoelectronics, College of Future Information Technology, Fudan University, Shanghai, 200433, China.ORCID https://orcid.org/0000-0002-9307-1566
Junhao ChuShanghai Frontiers Science Research Base of Intelligent Optoelectronics and Perception, Institute of Optoelectronics, College of Future Information Technology, Fudan University, Shanghai, 200433, China.

Funding

China Postdoctoral Science Foundation 2022M720751China Postdoctoral Science Foundation 2023T160119National Key Laboratory of Integrated Circuit Materials SKLJC-K2025-04National Natural Science Foundation of China 62304043National Natural Science Foundation of China 62374043National Natural Science Foundation of China U25A20482North University of China 2024-SYSJJ-06Shanghai Collaborative Innovation Center of Intelligent Perception Chip TechnologyShanghai Oriental Talent Program Youth ProjectShanghai Pilot Program for Basic Research-Fudan University 21TQ1400100Shanghai Pilot Program for Basic Research-Fudan University 25TQ001State Key Laboratory of Dynamic Measurement Technology
6 · The paper itself

Abstract

The explosive growth of artificial intelligence, big data, and the Internet of Things is driving an unprecedented demand for computing power and energy efficiency. However, conventional von Neumann architectures are increasingly constrained by the physical and economic limits of transistor scaling in the post-Moore era. Ferroelectric transistors (FeFETs) are far more than a novel memory technology and instead represent a revolutionary platform that seamlessly integrates nonvolatile storage, in-memory computation, and multi-modal sensing into a single, energy-efficient device, overcoming the bottlenecks of traditional computing architectures. This review provides a comprehensive overview of ferroelectric materials, including perovskite oxides, hafnium-based compounds, organics, and emerging 2D systems, emphasizing their polarization original mechanisms and structureproperty relationships. This study focuses on the device physics and engineering of three terminal FeFETs, with particular attention to the current issues, optimization strategies, and contrasting operation principles of ferroelectric dielectric and semiconductor-based designs. Finally, the expanding applications of FeFETs in nonvolatile memory, neuromorphic computing, and artificial intelligence hardware from device to system integration is discussed, and an outlook toward scalable, low-power, and multifunctional electronics driven by ferroelectric innovation is presented.

Indexed as

ferroelectric materialsferroelectric semiconductorfield effect transistorneuromorphic computingnon‐volatile memory

Identifiers

PMID41409012
PMCPMC13549272

What OpenQuestion holds

Textmetadata
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.