Evidence map›Paper›PMID 41386759›Full record

ArticleAdvanced science (Weinheim, Baden-Wurttemberg, Germany)2026

Defect Dynamics and Solution-Processed Interconnects in Perovskite-Organic Tandem Solar Cells.

Yingjie Hu, Qianyi Li, Kaifeng Jing, Jiangsheng Yu, Fuyi Zhou, Zhenhai Ai, You Chen, Yue Zhao, Yijia Zhang, Zhenyi Ni and 3 more

Abstract read
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In one paragraph

Article in Advanced science (Weinheim, Baden-Wurttemberg, Germany), 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

13 authors.

Yingjie HuDepartment of Electrical and Electronic Engineering, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, 999077, China.ORCID https://orcid.org/0009-0004-6777-8594
Qianyi LiDepartment of Electrical and Electronic Engineering, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, 999077, China.
Kaifeng JingDepartment of Electrical and Electronic Engineering, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, 999077, China.
Jiangsheng YuDepartment of Electrical and Electronic Engineering, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, 999077, China.
Fuyi ZhouState Key Laboratory of Silicon and Advanced Semiconductor Materials & School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027, China.
Zhenhai AiDepartment of Electrical and Electronic Engineering, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, 999077, China.
You ChenFaculty of Materials Science and Energy Engineering, Shenzhen University of Advanced Technology, Shenzhen, 518107, China.
Yue ZhaoDepartment of Electrical and Electronic Engineering, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, 999077, China.
Yijia ZhangDepartment of Electrical and Electronic Engineering, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, 999077, China.
Zhenyi NiState Key Laboratory of Silicon and Advanced Semiconductor Materials & School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027, China.
Yang BaiFaculty of Materials Science and Energy Engineering, Shenzhen University of Advanced Technology, Shenzhen, 518107, China.
Gang LiDepartment of Electrical and Electronic Engineering, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, 999077, China.
Guang YangDepartment of Electrical and Electronic Engineering, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, 999077, China.ORCID https://orcid.org/0000-0003-0994-9178

Funding

Hong Kong Polytechnic University 1-BEBBHong Kong Polytechnic University 1-CD7XHong Kong Polytechnic University 1-CDJ7Hong Kong Polytechnic University 1-CDLFHong Kong Polytechnic University 8-8480Hong Kong Polytechnic University Q-CDBKHong Kong Polytechnic University U-CDCCInnovation and Technology Commission - Hong Kong MHP/020/23Research Grants Council, University Grants Committee 15221320Research Grants Council, University Grants Committee 15307922Research Grants Council, University Grants Committee C4005-22YResearch Grants Council, University Grants Committee C7018-20GShenzhen Science and Technology Innovation Commission JCYJ20250604184249064
6 · The paper itself

Abstract

Perovskite and organic semiconductors exhibit analogous properties, including bandgap tunability, low-temperature solution processing, and high potential for lightweight applications. These similarities render them highly attractive for being integrated in multijunction architecture: perovskite-organic tandem solar cells (POTSCs). Nevertheless, the efficiency of POTSCs is limited by electrical losses, which stem from both the wide-bandgap (WBG) perovskite layers and the interconnecting layers (ICLs) between two subcells. These two essential components also constrain the tandem device stability. In this study, the underlying cause of open-circuit voltage (V

Indexed as

Defectsinterconnecting layersperovskite‐organic tandem solar cellsstabilityvoltage loss

Identifiers

PMID41386759
PMCPMC12948246

What OpenQuestion holds

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.