Electrically Active Defects and Traps and Their Relation to Stoichiometry and Chemical Environment in HfO

Dencho Spassov, Albena Paskaleva, Ivalina Avramova, Wojciech Wozniak, Elzbieta Guziewicz

Abstract read

In one paragraph

Article in Materials (Basel, Switzerland), 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it

0cells of the map it votes in

0citing papers in PubMed

–field-weighted citation impact

1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

5 authors.

Dencho SpassovInstitute of Solid State Physics, Bulgarian Academy of Sciences, 72 Tsarigradsko Chaussee, 1784 Sofia, Bulgaria.ORCID 0000-0002-9299-7148

Albena PaskalevaInstitute of Solid State Physics, Bulgarian Academy of Sciences, 72 Tsarigradsko Chaussee, 1784 Sofia, Bulgaria.ORCID 0000-0002-4409-1915

Ivalina AvramovaInstitute of General and Inorganic Chemistry, Bulgarian Academy of Sciences, 1113 Sofia, Bulgaria.ORCID 0000-0002-3290-9134

Wojciech WozniakInstitute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warsaw, Poland.

Elzbieta GuziewiczInstitute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warsaw, Poland.ORCID 0000-0001-6158-5258

Funding

Bulgarian Academy of Sciences and Polish Academy of Sciences IC-PL/03/2024-2025European Regional Development Fund BG16RFPR002-1.014-0006

6 · The paper itself

Abstract

Charge-trapping memory (CTM) is a viable contender to supersede the floating gate technology in high-density flash memory applications. To this end, very reliable charge storage in CTM should be secured. This requires optimization of trap density, their energy and spatial location as well as a deep understanding of their origin. In this work, we used X-ray photoelectron spectroscopy (XPS) to investigate chemical bonds in nanolaminated and doped HfO

Indexed as

Al-doped HfO2atomic layer deposition (ALD)charge trappingHfO2/Al2O3 stacksnon-volatile flash memoryX-ray photoelectron spectroscopy (XPS)

Identifiers

PMID41374261

DOI10.3390/ma18235420

PMCPMC12692849

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.