Evidence map›Paper›PMID 41331339›Full record

ArticleScientific reports2025

High sensitivity sensor for differential measurement of thickness of thin substrates using double T-shaped resonators.

Sajjad Azimi, Sarah Poormohammad, Aref Rasoulzadeh, Amirhosein Najafi

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Article in Scientific reports, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

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The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

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3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

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4 · The record

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PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

4 authors.

Sajjad AzimiDepartment of Electrical Engineering, Urmia University, Urmia, 5756151818, Iran.
Sarah PoormohammadDepartment of Electrical Engineering, Urmia University, Urmia, 5756151818, Iran. s.poormohammad@urmia.ac.ir.
Aref RasoulzadehDepartment of Electrical Engineering, Urmia University, Urmia, 5756151818, Iran.
Amirhosein NajafiDepartment of Electrical Engineering, Urmia University, Urmia, 5756151818, Iran.

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Non-destructive thickness measurement is an important procedure in industries such as aerospace, automotive, and construction. In this paper, we propose a simple yet high-performance method for measuring the thickness of thin layers using symmetrical double T-shaped resonators, which provide enhanced electric and magnetic field concentration in the sensing region, resulting in improved sensitivity and resolution. The proposed structure is based on a dual-band pass filter (DBPF) operating at 1.5 GHz and 2.47 GHz, designed to achieve intrinsic differential-mode operation without the need for external circuitry. In this microstrip structure, the thickness variation of the material under test (MUT) modifies the electric field intensity, which affects the inductance and capacitance values, and the sensing mechanism operates by detecting the resulting shift in the resonant frequency. In this configuration, the first transmission pole (TP) responds solely to ambient variations, while the second TP is sensitive to both thickness and ambient changes, providing a dual-function resonance mechanism that automatically compensates for environmental effects and improves measurement accuracy. A comprehensive equivalent circuit model is developed to establish the relationship between thickness and resonance behavior, and the parametric and lift-off analyses confirm the stability and repeatability of the design. The proposed sensor exhibits a Frequency Detection Resolution (FDR) of 307 and a sensitivity of 12.45%, outperforming most previously reported microwave sensors. Fabricated on an RO4003C dielectric substrate, the sensor demonstrates excellent agreement between simulation and experimental results. The overall size of the fabricated sensor is 97.55 mm × 24.24 mm × 0.508 mm, making it compact, cost-effective, and suitable for precise, robust, and non-destructive thickness measurement applications across materials science and engineering domains.

Indexed as

Differential modeHigh sensitivityMicrowave sensorThickness measurement

Identifiers

PMID41331339
PMCPMC12796372

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.