Evidence map›Paper›PMID 41302763›Full record

ArticleMicromachines2025

SPICE Model for SiC Bipolar Transistor and TTL Inverter Degradation Due to Gamma Radiation.

Alex Metreveli, Anders Hallén, Carl-Mikael Zetterling

Abstract read
In one paragraph

Article in Micromachines, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 2 papers.

0numbers the graph read from it
0cells of the map it votes in
2citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

2 citing papers in PubMed.

  1. Review
  2. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

3 authors.

Alex MetreveliDivision of Electronics and Embedded Systems, School of Electrical Engineering and Computer Science (EECS), KTH Royal Institute of Technology, Teknikringen 31, 100 44 Stockholm, Sweden.ORCID 0000-0003-1716-0222
Anders HallénDivision of Electronics and Embedded Systems, School of Electrical Engineering and Computer Science (EECS), KTH Royal Institute of Technology, Teknikringen 31, 100 44 Stockholm, Sweden.ORCID 0000-0002-8760-1137
Carl-Mikael ZetterlingDivision of Electronics and Embedded Systems, School of Electrical Engineering and Computer Science (EECS), KTH Royal Institute of Technology, Teknikringen 31, 100 44 Stockholm, Sweden.ORCID 0000-0001-8108-2631

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Silicon carbide (SiC) is a key material for electronics operating in harsh environments due to its wide bandgap, high thermal conductivity, and radiation hardness. In this work, we present a SPICE model for a 4H-SiC BJT and TTL inverter exposed to gamma radiation. The devices were fabricated using a dedicated SiC bipolar process at KTH (Sweden) and tested at the

Indexed as

BJTgamma radiationICinverterradiationSiCSPICEtransistor

Identifiers

PMID41302763
PMCPMC12654243

What OpenQuestion holds

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LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.