ArticleMicromachines2025
Single-Crystalline Si Stacked AlGaN/GaN High-Electron-Mobility Transistors with Enhanced Two-Dimensional Electron Gas Density.
Article in Micromachines, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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Abstract
High-electron-mobility transistors (HEMTs) are characterized by the formation of a two-dimensional electron gas (2DEG) induced by the polarization effects. Considerable studies have been conducted to improve the electrical properties of HEMTs by regulating the 2DEG density. In this study, a Si/GaN heterojunction was fabricated through the transfer of a heavily boron-doped Si nanomembrane. The holes in the p-Si layer integrated on top of the HEMT not only increased the surface positive charge, which eventually increased the density of electrons at the AlGaN/GaN interface, but also acted as a passivation layer to improve the performance of AlGaN/GaN HEMTs. Electrical characterization revealed that the maximum drain current increased from 668 mA/mm to 740 mA/mm, and the maximum transconductance improved from 200.2 mS/mm to 220.4 mS/mm. These results were due to the surface positive charge induced by the p-Si layer, which lowered the energy band diagram and increased the electron concentration at the AlGaN/GaN interface by a factor of 1.4 from 1.52 × 10
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