ArticleMicromachines2025
Localized Electric Field Tailoring to Balance Voltage Reliability, Current Density, and High-Frequency Performance of AlGaN/GaN HEMTs.
Article in Micromachines, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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Abstract
Emerging applications including advanced industrial manufacturing, cutting-edge scientific research and medical equipment demand AlGaN/GaN HEMTs possessing both high-frequency and high-voltage characteristics. However, a persistent trade-off remains between the frequency characteristics and breakdown characteristics of these devices. In this study, we employed localized electric field tailoring (LEFT) by introducing materials with different dielectric constants to construct a non-uniform composite gate dielectric layer, aiming to balance the breakdown voltage and cut-off frequency of the device. Device models were developed using APSYS-2018 software and their reliability was experimentally validated. Research data indicates that, compared to traditional uniform high-k (typically with dielectric constants k > 10, such as HfO
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