Evidence map›Paper›PMID 41290643›Full record

ArticleNature communications2025

Harnessing chaotic bifurcation in positive feedback transistors for secure and scalable random key generation.

Jiseong Im, Jonghyun Ko, Jisung Im, Joon Hwang, Ryun-Han Koo, Sung-Ho Park, Jangsaeng Kim, Wonjun Shin, Sung Yun Woo, Jong-Ho Lee

Abstract read
In one paragraph

Article in Nature communications, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

10 authors.

Jiseong ImDepartment of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, Republic of Korea.ORCID http://orcid.org/0000-0002-7260-9224
Jonghyun KoDepartment of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, Republic of Korea.
Jisung ImSchool of Electronics Engineering, Kyungpook National University, Daegu, Republic of Korea.ORCID http://orcid.org/0009-0006-8302-2011
Joon HwangDepartment of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, Republic of Korea.ORCID http://orcid.org/0000-0003-2998-8174
Ryun-Han KooDepartment of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, Republic of Korea.ORCID http://orcid.org/0000-0002-5708-3308
Sung-Ho ParkDepartment of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, Republic of Korea.ORCID http://orcid.org/0000-0001-7416-1059
Jangsaeng KimDepartment of Electronic Engineering, Sogang University, Seoul, Republic of Korea.ORCID http://orcid.org/0000-0003-4519-135X
Wonjun ShinDepartment of Semiconductor Convergence Engineering, Sungkyunkwan University, Suwon, Republic of Korea.ORCID http://orcid.org/0000-0001-9122-2458
Sung Yun WooSchool of Electronics Engineering, Kyungpook National University, Daegu, Republic of Korea. sywoo@knu.ac.kr.ORCID http://orcid.org/0000-0002-0857-3183
Jong-Ho LeeDepartment of Electrical and Computer Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul, Republic of Korea. jhl@snu.ac.kr.ORCID http://orcid.org/0000-0003-3559-9802

Funding

National Research Foundation of Korea (NRF) RS-2024-00405200National Research Foundation of Korea (NRF) RS-2025-10032968
6 · The paper itself

Abstract

In the era of big data, robust data security is more critical than ever. One promising way to create unpredictable random keys is to use the intrinsic physical randomness of electronic devices. However, controlling and reproducing this randomness remains a significant challenge. For the first time, we reveal a parabolic input-output relationship enabled by the band-to-band tunneling (BTBT) mechanism in a positive feedback transistor (PFT). By applying iterative operations, we observe chaotic bifurcation behavior, which allows the stable generation of analog random values across more than 10

Identifiers

PMID41290643
PMCPMC12722202

What OpenQuestion holds

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.