Evidence map›Paper›PMID 41270178›Full record

ArticleScience advances2025

A universal 2D-on-SiC platform for heterogeneous integration of epitaxial III-N membranes.

Se H Kim, Hanjoo Lee, Dong-Gwan Kim, Donghan Kim, Seokgi Kim, Hyunsoo Kim, Seoyong Ha, Hyunho Yang, Yunsu Jang, Jangho Yoon and 7 more

Abstract read
In one paragraph

Article in Science advances, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

17 authors.

Se H KimDepartment of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea.ORCID 0009-0004-1483-0352
Hanjoo LeeDepartment of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea.ORCID 0009-0009-1711-6839
Dong-Gwan KimDepartment of Advanced Materials Science and Engineering, Kyungpook National University, Daegu, South Korea.ORCID 0009-0005-0220-9152
Donghan KimDepartment of Electronic and Electrical Engineering, Kyungpook National University, Daegu, South Korea.ORCID 0009-0000-4393-1823
Seokgi KimDepartment of Nanotechnology and Advanced Materials Engineering, Sejong University, Seoul, South Korea.ORCID 0009-0004-3083-8581
Hyunsoo KimLX Semicon Co. Ltd., 222, Techno 2-ro, Yuseong-gu, Daejeon, South Korea.
Seoyong HaLX Semicon Co. Ltd., 222, Techno 2-ro, Yuseong-gu, Daejeon, South Korea.ORCID 0009-0000-0454-4505
Hyunho YangDepartment of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea.ORCID 0009-0007-4357-1582
Yunsu JangDepartment of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea.ORCID 0009-0004-3306-3339
Jangho YoonDepartment of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea.ORCID 0009-0006-7153-9881
ByoungTak LeeL&D Co. Ltd., 179, Daehak-ro, Yuseong-gu, Daejeon, South Korea.
Jung-Hee LeeL&D Co. Ltd., 179, Daehak-ro, Yuseong-gu, Daejeon, South Korea.
Roy Byung Kyu ChungDepartment of Advanced Materials Science and Engineering, Kyungpook National University, Daegu, South Korea.ORCID 0000-0002-1599-5034
Hongsik ParkDepartment of Electronic and Electrical Engineering, Kyungpook National University, Daegu, South Korea.ORCID 0000-0003-2582-2230
Sungkyu KimDepartment of Nanotechnology and Advanced Materials Engineering, Sejong University, Seoul, South Korea.ORCID 0000-0003-4544-3318
Tae Hoon LeeDepartment of Advanced Materials Science and Engineering, Kyungpook National University, Daegu, South Korea.ORCID 0000-0001-5553-5123
Hyun S KumDepartment of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea.ORCID 0000-0002-8009-569X

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Nonconventional epitaxial techniques, such as van der Waals epitaxy and remote epitaxy, have attracted substantial attention in the semiconductor research community for their capability to repeatedly produce high-quality freestanding films from a single mother wafer. Successful implementation of these techniques depends on creating a robust, uniform two-dimensional (2D) material surface. The conventional method for fabricating graphene on silicon carbide (SiC) is high-temperature graphitization. However, the extremely high temperature required for silicon sublimation (typically above 1500°C) causes step bunching, forming nonuniform multilayer graphene stripes and an unfavorable surface morphology for epitaxial growth. Here, we developed a wafer-scale graphitization technique that allows fast synthesis of single-crystalline graphene at low temperatures by metal-assisted graphitization. In contrast to previous reports, we found annealing conditions enabling SiC dissociation while avoiding silicide formation, producing uniform single-crystalline graphene while maintaining the pristine surface morphology of the substrate. We successfully produce high-quality freestanding single-crystalline III-N (AlN and GaN) membranes on graphene/SiC via the 2D material-based layer transfer technique.

Identifiers

PMID41270178
PMCPMC12637313

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.