ArticleThe journal of physical chemistry. C, Nanomaterials and interfaces2025
VIS-XUV Optical Constants and Electronic Band Parameters of a Tin-Oxo Cage Photoresist (Sn
Article in The journal of physical chemistry. C, Nanomaterials and interfaces, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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Abstract
Energy band parameters and VIS-XUV optical constants were measured on a Tin-Oxo cage photoresist by employing reflection electron energy loss spectra (REELS) and secondary electron-electron energy loss spectroscopy (SE2ELCS). Different kinematic conditions were chosen for the two reflection loss spectra in order to disentangle contributions of volume and surface losses. The normalized differential inverse inelastic mean free path (nDIIMFP) was extracted and fitted to a model dielectric function, described as a sum of Drude-type oscillators. The oscillator parameters were used to calculate the energy loss function (ELF) and the electron inelastic mean free path (IMFP). An energy gap of
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