ReviewMaterials (Basel, Switzerland)2025
All-Solution-Processable Robust Carbon Nanotube Photo-Thermoelectric Devices for Multi-Modal Inspection Applications.
Review in Materials (Basel, Switzerland), 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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9 authors.
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Abstract
While recent industrial automation trends emphasize the importance of non-destructive inspection by material-identifying millimeter-wave, terahertz-wave, and infrared (MMW, THz, IR) monitoring, fundamental tools in these wavelength bands (such as sensors) are still immature. Although inorganic semiconductors serve as diverse sensors with well-established large-scale fine-processing fabrication, the use of those devices is insufficient for non-destructive monitoring due to the lack of photo-absorbent properties for such major materials in partial regions across MMW-IR wavelengths. To satisfy the inherent advantageous non-destructive MMW-IR material identification, ultrabroadband operation is indispensable for photo-sensors under compact structure, flexible designability, and sensitive performances. This review then introduces the recent advances of carbon nanotube film-based photo-thermoelectric imagers regarding usable and high-yield device fabrication techniques and scientific synergy among computer vision to collectively satisfy material identification with three-dimensional (3D) structure reconstruction. This review synergizes material science, printable electronics, high-yield fabrication, sensor devices, optical measurements, and imaging into guidelines as functional non-destructive inspection platforms. The motivation of this review is to introduce the recent scientific fusion of MMW-IR sensors with visible-light computer vision, and emphasize its significance (non-invasive material-identifying sub-millimeter-resolution 3D-reconstruction with 660 nm-1.15 mm-wavelength imagers at noise equivalent power within 100 pWHz
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