ArticleACS applied electronic materials2025
Molecular Electronics Meets Direct-Write Carbon Nanofabrication via Focused Electron-Beam-Induced Deposition (FEBID): A Platform for Junction Architecture Design.
Article in ACS applied electronic materials, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.
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The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.
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Who cites it
1 citing paper in PubMed.
- Conductive cobalt-based deposits grown by Cryo-FEBID for application as top-contact electrodes in large-area molecular electronic devices.Microsystems & nanoengineering · 2026Article
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Authors and funding
12 authors.
Funding
No grant is acknowledged in the PubMed record.
Abstract
The electrical characteristics of a molecular junction are highly sensitive to the nature and uniformity of the molecule|electrode contacts. This gives rise to significant interest in the development of not only the active molecular structures that modulate charge transport and the anchor groups that contact them to the electrodes, but also methods for assembling uniform molecular monolayers on a substrate electrode and subsequent fabrication of a "top electrode" to achieve the reliable fabrication of viable molecular electronic devices. In this contribution, 4-(4-(4-(trimethylsilylethynyl)-phenylethynyl)-phenylethynyl)-aniline was converted to the corresponding diazonium salt and electrografted onto highly oriented pyrolytic graphite (HOPG), resulting in an organized monolayer covalently bonded to the HOPG "substrate" electrode. Subsequently, focused electron-beam-induced deposition was used to form an amorphous carbon top electrode (C-FEBID) onto the monolayer from a naphthalene precursor. By guiding the raster scanning of the electron beam, the position, shape, and thickness of the carbon electrode "written" onto the monolayer can be controlled with nanometer precision. In addition, as a proof-of-principle demonstration of the construction of the interconnects necessary for integration of molecular devices, platinum was deposited precisely on top of the C-FEBID electrodes, using focused-ion-beam-induced deposition of PtMe
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