ArticleScientific reports2025
Test-retest reliability of intra-epidermal electrically evoked potentials in comparison with other modalities and across stimulation intensities.
Article in Scientific reports, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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Abstract
Intra-epidermal electrically evoked potentials (IEEPs) might represent a promising method for an improved characterization of certain spinal pathologies. Before successful clinical implementation, investigating IEEPs reliability is a prerequisite. This study aimed to assess the test-retest reliability of IEEPs compared to contact heat (CHEPs) and pinprick (PEPs) evoked potentials (Experiment 1) and across different intra-epidermal electrical stimulation (IES) intensities (Experiment 2). Experiment 1 included 26 participants (12f, 25.3 ± 4.6years) and assessed pain-related evoked potentials (PREPs) following contact heat (35-60 °C), pinprick (256 mN), and IES (2 × electrical detection threshold, EDT) to the volar forearm. Experiment 2 included 30 participants (20f, 27.7 ± 3.7years) and assessed IEEPs at four IES intensities (1.5 ×, 2 ×, 4 × EDT, and 0.5 mA). Both experiments assessed test-retest reliability with intraclass correlation coefficients (ICCs) and Bland-Altman analyses for N-latencies, NP-amplitudes, and pain ratings. While IEEPs at 2 × EDT in Experiment 1 showed "excellent" reliability for NP-amplitude, comparable to CHEPs and PEPs, reliability for N-latency and pain ratings ranged from "poor" to "fair". This reliability of IEEP N-latencies and pain ratings improved to "good" and "excellent" by applying higher intensities of IES such as 4 × EDT and 0.5 mA. Given the high reliability of IEEPs at 4 × EDT and 0.5 mA, these intensities may be recommendable for clinical application.
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