Evidence map›Paper›PMID 41143115›Full record

ArticleResearch (Washington, D.C.)2025

Hierarchically Converged Defect Engineering with 2-Dimensional Black Phosphorus/MXene Sequence for Sensitive Photoelectrochemical-Electrostatic Sensors.

Wei Zeng, Yuan Zhang, Zhengyin Wu, Zichu Zhang, Liting Deng, Yuan Tian, Mengying Che, Yiming Chen, Yi Xiong, Yumin Wang and 4 more

Abstract read
In one paragraph

Article in Research (Washington, D.C.), 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

14 authors.

Wei ZengNational Key Laboratory of Opto-Electronic Information Acquisition and Protection Technology, Anhui University, Hefei 230601, Anhui, China.
Yuan ZhangNational Key Laboratory of Opto-Electronic Information Acquisition and Protection Technology, Anhui University, Hefei 230601, Anhui, China.
Zhengyin WuNational Key Laboratory of Opto-Electronic Information Acquisition and Protection Technology, Anhui University, Hefei 230601, Anhui, China.
Zichu ZhangNational Key Laboratory of Opto-Electronic Information Acquisition and Protection Technology, Anhui University, Hefei 230601, Anhui, China.
Liting DengNational Key Laboratory of Opto-Electronic Information Acquisition and Protection Technology, Anhui University, Hefei 230601, Anhui, China.
Yuan TianNational Key Laboratory of Opto-Electronic Information Acquisition and Protection Technology, Anhui University, Hefei 230601, Anhui, China.
Mengying CheNational Key Laboratory of Opto-Electronic Information Acquisition and Protection Technology, Anhui University, Hefei 230601, Anhui, China.
Yiming ChenNational Key Laboratory of Opto-Electronic Information Acquisition and Protection Technology, Anhui University, Hefei 230601, Anhui, China.
Yi XiongAnalytical and Testing Center, School of Bioengineering and Health, School of Electronics and Electrical Engineering, Hubei Provincial Engineering Research Center for Wide-Bandgap Semiconductor Materials and Devices, Wuhan Textile University, Wuhan, 430073, Hubei, China.ORCID https://orcid.org/0000-0002-7640-3303
Yumin WangSchool of Physics and Technology, Key Laboratory of Nuclear Solid State Physics Hubei Province, Wuhan University, Wuhan 430072, China.
Pengfei FangSchool of Physics and Technology, Key Laboratory of Nuclear Solid State Physics Hubei Province, Wuhan University, Wuhan 430072, China.
Yun TangAnalytical and Testing Center, School of Bioengineering and Health, School of Electronics and Electrical Engineering, Hubei Provincial Engineering Research Center for Wide-Bandgap Semiconductor Materials and Devices, Wuhan Textile University, Wuhan, 430073, Hubei, China.
Shuoxue JinMulti-disciplinary Research Division, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China.
Suiting NingSchool of Science, Hubei University of Technology, Wuhan 430068, China.

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

The function-integrated sensors have harvested increasingly vital across diverse applications, especially in the field of smart wearables, yet optimizing the synergy between electrostatic and light signals in photoelectrochemical (PEC) systems remains a critical challenge. Here, we fabricate a hierarchical ZnO/Bi

Identifiers

PMID41143115
PMCPMC12550280

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.