ArticleJournal of microscopy2025
Depth of field of multi-slice electron ptychography: Investigating energy and convergence angle.
Article in Journal of microscopy, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 2 papers.
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The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.
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Who cites it
2 citing papers in PubMed.
- phaser: a unified and extensible framework for fast electron ptychography.npj computational materials · 2026Article
- Depth of field of multi-slice electron ptychography: Investigating energy and convergence angle.Journal of microscopy · 2025Article
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Authors and funding
4 authors.
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Abstract
Multi-slice electron ptychography has attracted significant interest in recent years, thanks to notable experimental successes in ultra-high resolution, depth-resolved imaging of atomic structure. However, the theoretical dependence of depth of field on experimental parameters is not well understood. In this paper we use simulated data to compare the depth of field of through focal annular-dark field and multi-slice electron ptychography over a range of acceleration voltages and convergence angles. We show that at both low convergence angle and at low electron energy, multi-slice ptychography has significantly improved depth of field over through focal ADF imaging.
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