Evidence map›Paper›PMID 41018602›Full record

ArticleACS omega2025

Structural and Electric Characterization of Sputtered Pt/WSe

Ryuichi Nakajima, Tomonori Nishimura, Kaito Kanahashi, Shogo Hatayama, Wen Hsin Chang, Yuta Saito, Toshifumi Irisawa, Keiji Ueno, Yasumitsu Miyata, Takashi Taniguchi and 2 more

Abstract read
PubMed Full text at PMC Publisher
In one paragraph

Article in ACS omega, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

12 authors.

Ryuichi NakajimaDepartment of Materials Engineering, The University of Tokyo, Tokyo 113-8656, Japan.
Tomonori NishimuraDepartment of Materials Engineering, The University of Tokyo, Tokyo 113-8656, Japan.ORCID https://orcid.org/0000-0002-8000-5164
Kaito KanahashiDepartment of Materials Engineering, The University of Tokyo, Tokyo 113-8656, Japan.ORCID https://orcid.org/0000-0003-2571-3384
Shogo HatayamaSemiconductor Frontier Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki 305-8569, Japan.ORCID https://orcid.org/0000-0002-2914-1072
Wen Hsin ChangSemiconductor Frontier Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki 305-8569, Japan.ORCID https://orcid.org/0000-0002-8501-6276
Yuta SaitoDevice Technology Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki 305-8569, Japan.ORCID https://orcid.org/0000-0002-9576-1560
Toshifumi IrisawaDevice Technology Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki 305-8569, Japan.
Keiji UenoDepartment of Chemistry, Saitama University, Saitama 338-8570, Japan.
Yasumitsu MiyataDepartment of Physics, Tokyo Metropolitan University, Tokyo 192-0397, Japan.ORCID https://orcid.org/0000-0002-9733-5119
Takashi TaniguchiResearch Center for Materials Nanoarchitectonics, National Institute for Materials Science, Ibaraki 305-0044, Japan.ORCID https://orcid.org/0000-0002-1467-3105
Kenji WatanabeResearch Center for Electronic and Optical Materials, National Institute for Materials Science, Ibaraki 305-0044, Japan.ORCID https://orcid.org/0000-0003-3701-8119
Kosuke NagashioDepartment of Materials Engineering, The University of Tokyo, Tokyo 113-8656, Japan.ORCID https://orcid.org/0000-0003-1181-8644

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

For high-performance p-type field-effect transistors (FETs) based on two-dimensional (2D) materials, the use of Pt as the contact metal, with its high work function, is advantageous for effective hole injection into the 2D channel. However, the high-energy sputtering process required to deposit Pt, due to its high melting point, often induces significant damage to the 2D materials. Recently, the achievement of nearly ideal van der Waals contacts in Sb

Identifiers

PMID41018602
PMCPMC12461392

What OpenQuestion holds

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Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.