Evidence map›Paper›PMID 40993257›Full record

ArticleNature2025

Electrostatic-repulsion-based transfer of van der Waals materials.

Xudong Zheng, Jiangtao Wang, Jianfeng Jiang, Tianyi Zhang, Jiadi Zhu, Tong Dang, Peng Wu, Ang-Yu Lu, Ding-Rui Chen, Tilo H Yang and 11 more

Abstract read
PubMed Publisher
In one paragraph

Article in Nature, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 11 papers.

0numbers the graph read from it
0cells of the map it votes in
11citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

11 citing papers in PubMed.

  1. Article
  2. Article
  3. Article
  4. Deep Reconstruction of Ni(OH)Small (Weinheim an der Bergstrasse, Germany) · 2026
    Article
  5. Article
  6. Review
  7. Article
  8. Article
  9. Review
  10. Article
  11. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

21 authors.

Xudong Zheng *Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA. xudongz@mit.edu.ORCID http://orcid.org/0009-0009-3783-7617
Jiangtao Wang *Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA. wangjt@mit.edu.ORCID http://orcid.org/0000-0001-7323-4690
Jianfeng Jiang *Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA.
Tianyi ZhangDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA.ORCID http://orcid.org/0000-0002-8998-3837
Jiadi ZhuDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA.ORCID http://orcid.org/0000-0001-7319-3913
Tong DangDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA.ORCID http://orcid.org/0000-0001-7674-4290
Peng WuDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA.ORCID http://orcid.org/0000-0001-9866-0450
Ang-Yu LuDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA.
Ding-Rui ChenDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA.
Tilo H YangDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA.ORCID http://orcid.org/0000-0002-7048-9513
Xinyuan ZhangDepartment of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA.ORCID http://orcid.org/0000-0002-5135-2204
Kenan ZhangDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA.ORCID http://orcid.org/0000-0003-1343-6068
Kyung Yeol MaDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA.ORCID http://orcid.org/0000-0003-4652-1912
Zhien WangDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA.ORCID http://orcid.org/0000-0002-6120-1952
Aijia YaoDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA.
Haomin LiuDepartment of Materials Science and Engineering, National University of Singapore, Singapore, Singapore.
Yi WanDepartment of Materials Science and Engineering, National University of Singapore, Singapore, Singapore.ORCID http://orcid.org/0000-0002-6202-4193
Ya-Ping HsiehInstitute of Atomic and Molecular Sciences, Academia Sinica, Taipei, Taiwan.ORCID http://orcid.org/0000-0002-6065-751X
Vladimir BulovićDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA.ORCID http://orcid.org/0000-0002-0960-2580
Tomás PalaciosDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA.
Jing KongDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA. jingkong@mit.edu.ORCID http://orcid.org/0000-0003-0551-1208

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Van der Waals (vdW) materials offer unique opportunities for 3D integration

Identifiers

PMID40993257

What OpenQuestion holds

Textmetadata
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.