ArticleNano letters2025
Angle-Resolved Cathodoluminescence Interferometry of Plasmonic and Dielectric Scatterers.
Article in Nano letters, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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5 authors.
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Abstract
We demonstrate angle-resolved cathodoluminescence (CL) interferometry from electron-beam-excited plasmonic and dielectric nanostructures placed above a Au-coated substrate. We use 20-30 keV electrons to coherently excite plasmon-mediated radiation, which interferes with its mirror image, providing a method to determine the particle-substrate spacing. In an aloof excitation geometry, transition radiation emitted from the Au substrate adds to the interferogram and provides a means to probe the electron traveling time. The measured CL interferograms are in excellent agreement with a scattering and interferometry model in which a single electron coherently launches plasmons at two separate locations. Polarization-resolved CL measurements confirm the interferometric scattering model. Electron-excited Si Mie scatterers show interferograms modulated with resonantly enhanced emission. CL interferometry enables accurate measurement of critical distances in nanoscale geometries, in particular along the electron-beam direction, which are not easily accessible in electron microscopy, while offering a platform for studying optical interference in complex geometries.
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