Evidence map›Paper›PMID 40960898›Full record

ReviewAdvanced science (Weinheim, Baden-Wurttemberg, Germany)2025

Strategic Mobility Engineering in 2D Semiconductor-based FETs for Enhanced Electronic Devices.

Sheila Sim, Sichao Li, Weifan Cai, Baiyu Yu, Xin Ju, Jing Cao, Zhaogang Dong, Xinmao Yin, Sunmi Shin, Yue Luo and 4 more

Abstract readReview
In one paragraph

Review in Advanced science (Weinheim, Baden-Wurttemberg, Germany), 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.

0numbers the graph read from it
0cells of the map it votes in
3citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

3 citing papers in PubMed.

  1. Article
  2. Review
  3. Strategic Mobility Engineering in 2D Semiconductor-based FETs for Enhanced Electronic Devices.Advanced science (Weinheim, Baden-Wurttemberg, Germany) · 2025
    Review
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

14 authors.

Sheila SimSchool of Electronic Science & Engineering, Southeast University, Nanjing, 211189, China.
Sichao LiDepartment of Mechanical Engineering, College of Design and Engineering, National University of Singapore, Singapore, 117575, Singapore.
Weifan CaiInstitute of Materials Research and Engineering (IMRE), Agency for Science, Technology and Research (A*STAR), 2 Fusionopolis Way, Innovis #08-03, Singapore, 138634, Republic of Singapore.
Baiyu YuSchool of Electronic Science & Engineering, Southeast University, Nanjing, 211189, China.
Xin JuInstitute of Materials Research and Engineering (IMRE), Agency for Science, Technology and Research (A*STAR), 2 Fusionopolis Way, Innovis #08-03, Singapore, 138634, Republic of Singapore.
Jing CaoInstitute of Materials Research and Engineering (IMRE), Agency for Science, Technology and Research (A*STAR), 2 Fusionopolis Way, Innovis #08-03, Singapore, 138634, Republic of Singapore.
Zhaogang DongScience, Mathematics, and Technology (SMT), Singapore University of Technology and Design (SUTD), 8 Somapah Road, Singapore, 487372, Singapore.
Xinmao YinShanghai Key Laboratory of High Temperature Superconductors, Institute for Quantum Science and Technology, Physics Department, Shanghai University, Shanghai, 200444, China.
Sunmi ShinDepartment of Mechanical Engineering, College of Design and Engineering, National University of Singapore, Singapore, 117575, Singapore.
Yue LuoSchool of Electronic Science & Engineering, Southeast University, Nanjing, 211189, China.
Dongzhi ChiInstitute of Materials Research and Engineering (IMRE), Agency for Science, Technology and Research (A*STAR), 2 Fusionopolis Way, Innovis #08-03, Singapore, 138634, Republic of Singapore.
Ady SuwardiDepartment of Electronic Engineering, The Chinese University of Hong Kong, Sha Tin, New Territories, Hong Kong SAR, 999077, China.
Hong Kuan NgInstitute of Materials Research and Engineering (IMRE), Agency for Science, Technology and Research (A*STAR), 2 Fusionopolis Way, Innovis #08-03, Singapore, 138634, Republic of Singapore.
Jing WuSchool of Electronic Science & Engineering, Southeast University, Nanjing, 211189, China.ORCID https://orcid.org/0000-0002-4182-6701

Funding

MTC Young Individual Research Grant M24N8c0104National Key R & D Project of China 2024YFA1207900National Natural Science Foundation of China 62404042Natural Science Foundation of Jiangsu Province BK20241289Shun Hing Institute of Advanced Engineering 4055224
6 · The paper itself

Abstract

As silicon-based electronics approach the physical limits of Moore's Law, 2-Dimensional (2D) semiconductors emerge as promising candidates for next-generation electronic devices due to their atomic-scale thickness and inherently high carrier mobilities. These materials offer superior electrostatic control, mitigating short-channel effects while enabling continued device scaling. However, challenges such as contact resistance and suboptimal channel properties continue to impede carrier transport, necessitating advanced mobility engineering strategies. This review comprehensively evaluates recent approaches to enhance carrier mobility in 2D semiconductor-based field-effect transistors (FETs), including doping, metal-semiconductor interface optimization, effective mass engineering, scattering mechanism manipulation, work function tuning, and strain engineering. These strategies improve critical device parameters like current drive, subthreshold swing, and on/off ratios by optimizing carrier transport efficiency. By linking material-level advancements to circuit-level performance, this work underscores the pivotal role of mobility engineering in enabling scalable, high-performance 2D electronics. These insights pave the way for transitioning 2D materials from laboratory research to practical applications, overcoming the limitations of conventional silicon technologies and driving innovations in high-performance, energy-efficient electronics.

Indexed as

2D materialsfield‐effect‐transistormobility engineering

Identifiers

PMID40960898
PMCPMC12561449

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.