Evidence map›Paper›PMID 40948243›Full record

Observational studyJapan journal of nursing science : JJNS2025

Incidence and root cause analysis of near-miss events in medical device use errors in intensive care units using Ishikawa diagram.

Su Mi Seong, Hyeop Oh, Jae Suk Park, Su Hyun Bae, Ki Chang Nam, Sung Yun Park, Bum Sun Kwon, Bo Hae Kim

Abstract readObservational Study
In one paragraph

Observational study in Japan journal of nursing science : JJNS, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Observational
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

8 authors.

Su Mi SeongDepartment of Otorhinolaryngology-Head and Neck Surgery, Dongguk University Ilsan Hospital, Goyang, Korea.ORCID https://orcid.org/0009-0008-9258-9823
Hyeop OhDepartment of Otorhinolaryngology-Head and Neck Surgery, Dongguk University Ilsan Hospital, Goyang, Korea.ORCID https://orcid.org/0009-0008-5502-7485
Jae Suk ParkDepartment of Nursing, Dongguk University Ilsan Hospital, Goyang, Korea.ORCID https://orcid.org/0009-0009-1756-1254
Su Hyun BaeDepartment of Nursing, Dongguk University Ilsan Hospital, Goyang, Korea.ORCID https://orcid.org/0009-0000-8256-2151
Ki Chang NamCenter for Medical Device Safety Information Monitoring, Dongguk University Ilsan Hospital, Goyang, Korea.ORCID https://orcid.org/0000-0002-0484-7845
Sung Yun ParkCenter for Medical Device Safety Information Monitoring, Dongguk University Ilsan Hospital, Goyang, Korea.ORCID https://orcid.org/0000-0001-9902-3090
Bum Sun KwonCenter for Medical Device Safety Information Monitoring, Dongguk University Ilsan Hospital, Goyang, Korea.ORCID https://orcid.org/0000-0001-7755-435X
Bo Hae KimDepartment of Otorhinolaryngology-Head and Neck Surgery, Dongguk University Ilsan Hospital, Goyang, Korea.ORCID https://orcid.org/0000-0002-4645-0678

Funding

National Research Foundation of Korea RS-2024-00344950
6 · The paper itself

Abstract

aimThis study aimed to investigate the incidence of near-miss events related to medical device use errors (MUEs) in intensive care units (ICUs) and to identify their root causes using the Ishikawa diagram.

methodsThis observational study was conducted in a referral hospital ICU in South Korea between August and September 2023, involving 60 nurses (29 MICU, 31 SICU) who completed anonymized questionnaires on near-miss events related to five commonly used medical devices. Root causes were analyzed with a modified Ishikawa diagram. Data were processed using SPSS software. Independent t-tests, ANOVA, and Pearson correlation were used for continuous variables, while chi-square and Fisher's exact tests were applied to categorical data. One-way ANOVA identified major contributing factors.

resultsEach participant experienced an average of 2.11 ± 12.53 near-miss events per device per year, with the highest incidence in IV line sets. A positive correlation was found between near-miss frequency and years of work experience. Root cause analysis (RCA) showed that the most common contributing factors were work environment factors, especially high patient load. The main contributing factors included chronic fatigue (personal factors), frequent device malfunctions (medical device usability factors), and insufficient education programs (unit communication and culture/education factors).

conclusionsThe study highlights the importance of improving working conditions, updating outdated equipment, and strengthening educational programs to reduce MUEs and improve patient safety in ICUs.

Indexed as

Equipment and SuppliesIntensive Care UnitsMedical ErrorsNear Miss, HealthcareRoot Cause AnalysisAdultFemaleHumansIncidenceMaleRepublic of KoreaSurveys and Questionnaireshealthcare near missesintensive care unitsmedical errorspatient safetyroot cause analysis

Identifiers

PMID40948243
PMCPMC12434650

What OpenQuestion holds

Textmetadata
LicenceCC BY
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Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.