Evidence map›Paper›PMID 40923475›Full record

ArticleAdvanced materials (Deerfield Beach, Fla.)2026

High-Performance Air-Stable Polymer Monolayer Transistors for Monolithic 3D CMOS logics.

Miao Cheng, Yanqin Zhang, Jinyao Wang, Haonan Wang, Yifan Xie, Shuaidi Zhang, Changrui Liu, Jingyun Chu, Feng Zhang, Zhenzhong Yang and 4 more

Abstract read
In one paragraph

Article in Advanced materials (Deerfield Beach, Fla.), 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.

0numbers the graph read from it
0cells of the map it votes in
3citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

3 citing papers in PubMed.

  1. Wafer-Scale 3D Integration for High-Density Multi-Valued Neuromorphic Logic.Advanced science (Weinheim, Baden-Wurttemberg, Germany) · 2026
    Article
  2. Article
  3. Review
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

14 authors.

Miao ChengState Key Laboratory of Fabrication Technologies for Integrated Circuits, Chinese Academy of Sciences, Beijing, 100029, China.
Yanqin ZhangState Key Laboratory of Fabrication Technologies for Integrated Circuits, Chinese Academy of Sciences, Beijing, 100029, China.
Jinyao WangState Key Laboratory of Fabrication Technologies for Integrated Circuits, Chinese Academy of Sciences, Beijing, 100029, China.
Haonan WangKey Laboratory of Polar Materials and Devices (MOE) and Department of Electronics, East China Normal University, Shanghai, 200241, China.
Yifan XieState Key Laboratory of Fabrication Technologies for Integrated Circuits, Chinese Academy of Sciences, Beijing, 100029, China.
Shuaidi ZhangState Key Laboratory of Fabrication Technologies for Integrated Circuits, Chinese Academy of Sciences, Beijing, 100029, China.
Changrui LiuState Key Laboratory of Fabrication Technologies for Integrated Circuits, Chinese Academy of Sciences, Beijing, 100029, China.
Jingyun ChuState Key Laboratory of Fabrication Technologies for Integrated Circuits, Chinese Academy of Sciences, Beijing, 100029, China.
Feng ZhangState Key Laboratory of Fabrication Technologies for Integrated Circuits, Chinese Academy of Sciences, Beijing, 100029, China.
Zhenzhong YangKey Laboratory of Polar Materials and Devices (MOE) and Department of Electronics, East China Normal University, Shanghai, 200241, China.
Zilong ZhengThe College of Materials Science and Engineering, Beijing University of Technology, Beijing, 100083, China.
Mingjian WuInstitute of Micro- and Nanostructure Research & Center for Nanoanalysis and Electron Microscopy (CENEM), Department of Materials Science, Friedrich-Alexander-Universität Erlangen-Nürnberg, D-91058, Erlangen, Germany.
Ling LiState Key Laboratory of Fabrication Technologies for Integrated Circuits, Chinese Academy of Sciences, Beijing, 100029, China.
Mengmeng LiState Key Laboratory of Fabrication Technologies for Integrated Circuits, Chinese Academy of Sciences, Beijing, 100029, China.ORCID https://orcid.org/0000-0003-1117-8106

Funding

National Key R&D Program of China 2019YFA0706100National Natural Science Foundation of China 62074163Natural Science Foundation of Beijing Municipality JQ24030
6 · The paper itself

Abstract

The monolayer transistor, where the semiconductor layer is a single molecular layer, offers an ideal platform for exploring transport mechanisms both theoretically and experimentally by eliminating the influence of spatially correlated microstructure. However, the structure-property relations in polymer monolayers remain poorly understood, leading to low transistor performance to date. Herein, a self-confinement effect is demonstrated in the polymer monolayer with nanofibrillar microstructures and edge-on orientation, as characterized by the 4D scanning confocal electron diffraction method. The polymer chains align parallel to the nanofiber long axis, while the π-stacking direction aligns perpendicular to this axis. To reduce the trap density at the semiconductor/dielectric interface, a top-gate configuration is employed with CYTOP as gate dielectric, and the resulting monolayer transistors achieve a field-effect mobility of 7.12 cm

Indexed as

complementary logicsdevice stabilitymonolithic 3D integrationpolymer monolayer transistorsstructure‐property relation

Identifiers

PMID40923475
PMCPMC12878800

What OpenQuestion holds

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Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.