ArticleCommunications materials2025
3D/4D imaging of complex and deformed microstructures with pink-beam dark field X-ray microscopy.
Article in Communications materials, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 6 papers.
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Who cites it
6 citing papers in PubMed.
- Deterministic segmentation of grains in dense Laue microdiffraction datasets.Journal of applied crystallography · 2026Article
- An efficient wave-optics framework for partially coherent pink X-ray beam simulation and analysis.Journal of synchrotron radiation · 2026Article
- Revealing 3D strain and carbide architectures in additively manufactured Ni superalloys.Nature communications · 2026Article
- Quantifying resolution in pink-beam dark-field X-ray microscopy: experiments and simulations.Journal of applied crystallography · 2026Article
- A high-temperature furnace for multimodal synchrotron-based X-ray microscopy and diffraction imaging.Journal of synchrotron radiation · 2026Article
- Advances in artificial intelligence-based approaches to enhance dark field X-ray microscopy analysis.MRS communications · 2026Review
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Authors and funding
11 authors.
Funding
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Abstract
Dark Field X-ray Microscopy (DFXM) has advanced 3D non-destructive, high-resolution imaging of strain and orientation in crystalline materials, enabling the study of embedded structures in bulk. However, the photon-hungry nature of monochromatic DFXM limits its applicability for studying highly deformed or weakly crystalline structures, and constrains time-resolved studies in industrially relevant materials. Here, we present pink-beam DFXM (pDFXM) at the ID03 beamline of ESRF, achieving a 27-fold increase in diffracted intensity while maintaining 100 nm spatial resolution. We validate pDFXM by imaging a partially recrystallized aluminum grain, confirming sufficient angular resolution for microstructure mapping. The increased flux significantly enhances the diffracted signal, enabling the resolution of subgrain structures. Additionally, we image a highly deformed ferritic iron grain, previously inaccessible in monochromatic mode without focusing optics. Beyond static imaging, pDFXM enables real-time tracking of grain growth during annealing, achieving hundred-millisecond temporal resolution. By combining high photon flux with non-destructive, high-resolution 3D mapping, pDFXM expands diffraction-contrast imaging to poorly diffracting crystals, unlocking new opportunities for studying grain growth, fatigue, and corrosion in bulk materials.
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