Evidence map›Paper›PMID 40885751›Full record

ArticleScientific reports2025

Multimodal characterization of Te inclusions in Cd

Rosemary Cortes Robles, Vincent G Marrero Torres, Cong Tai Trinh, Michael T Pettes, Ralph B James, Stephen U Egarievwe, Mebougna Drabo, Utpal N Roy, Ratnakar Palai, Han Htoon and 1 more

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Article in Scientific reports, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

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0citing papers in PubMed
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1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

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Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

11 authors.

Rosemary Cortes RoblesCenter for Integrated Nanotechnologies, Materials Physics and Applications Division, Los Alamos National Laboratory, Los Alamos, NM, 87545, USA.
Vincent G Marrero TorresCenter for Integrated Nanotechnologies, Materials Physics and Applications Division, Los Alamos National Laboratory, Los Alamos, NM, 87545, USA.
Cong Tai TrinhCenter for Integrated Nanotechnologies, Materials Physics and Applications Division, Los Alamos National Laboratory, Los Alamos, NM, 87545, USA.
Michael T PettesCenter for Integrated Nanotechnologies, Materials Physics and Applications Division, Los Alamos National Laboratory, Los Alamos, NM, 87545, USA.
Ralph B JamesSavannah River National Laboratory, Aiken, SC, 29808, USA.
Stephen U EgarievweMorgan State University, Baltimore, MD, 21251, USA.
Mebougna DraboAlabama A&M University, Normal, AL, 35762, USA.
Utpal N RoySavannah River National Laboratory, Aiken, SC, 29808, USA.
Ratnakar PalaiDepartment of Physics, University of Puerto Rico, Rio Piedras, San Juan, PR, 00931, USA.
Han HtoonCenter for Integrated Nanotechnologies, Materials Physics and Applications Division, Los Alamos National Laboratory, Los Alamos, NM, 87545, USA.
Andrew C JonesCenter for Integrated Nanotechnologies, Materials Physics and Applications Division, Los Alamos National Laboratory, Los Alamos, NM, 87545, USA. acj@lanl.gov.

Funding

Department of Energy 89233218CNA000001Department of Energy (DoE), Office of the National Nuclear Security Administration (NNSA) Minority Serving Institutions Internship Program DE-NA0003980
6 · The paper itself

Abstract

While CdZnTe (CZT) and CdZnTeSe (CZTS) semiconductors have emerged as compounds for room-temperature gamma and X-ray detection materials, they continue to be constrained by the formation of Te-inclusion defects generated during the growth and post-growth phases of the material, which adversely affect the detector performance. We demonstrate the utility of multimodal microscopic imaging and analysis for the characterization of the optical and electronic properties of Te inclusions in CZT and CZTS crystals at both micron and nanometer length scales. Having first identified regions with micron-scale Te inclusions using confocal Raman microscopy techniques, optically coupled infrared scattering near-field optical microscopic mapping was performed to map the distribution of these inclusions with nanometer spatial resolution and correlate the presence of Te inclusions in the matrix with other properties. Kelvin probe force microscopy was then utilized to characterize the variations of the work function associated with the presence of Te inclusions. Here, we observe an increase of ~ 240 mV in the work function associated with Te inclusions compared to the bulk CZT/CZTS crystals. Additionally, we observe that individual bulk grains in CZT can exhibit slight potential variations. Our findings develop a portrait of the charge trapping mechanisms in CZT and CZTS that act to degrade detector performance, while the demonstration of these combined microscopy techniques provides a new analytical tool that can be utilized for further optimization of the detector performance for these semiconducting compounds.

Identifiers

PMID40885751
PMCPMC12398591

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