Evidence map›Paper›PMID 40872424›Full record

ArticleMicromachines2025

Total Ionizing Dose Effect Simulation Modeling and Analysis for a DCAP Power Chip.

Xinfang Liao, Danyang Lei, Yanjun Fu, Yuchen Liu, Kangqi Huang, Yuan Wei, Yinghong Zuo, Yashi Ying, Yi Liu, Changqing Xu and 1 more

Abstract read
PubMed Full text at PMC Publisher
In one paragraph

Article in Micromachines, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

11 authors.

Xinfang LiaoGuangzhou Institute of Technology, Xidian University, Guangzhou 510555, China.ORCID 0000-0003-0735-5106
Danyang LeiGuangzhou Institute of Technology, Xidian University, Guangzhou 510555, China.
Yanjun FuNorthwest Institute of Nuclear Technology, Xi'an 710024, China.
Yuchen LiuSchool of Microelectronics, Xidian University, Xi'an 710071, China.
Kangqi HuangSchool of Microelectronics, Xidian University, Xi'an 710071, China.
Yuan WeiNorthwest Institute of Nuclear Technology, Xi'an 710024, China.
Yinghong ZuoNorthwest Institute of Nuclear Technology, Xi'an 710024, China.
Yashi YingGuangzhou Institute of Technology, Xidian University, Guangzhou 510555, China.
Yi LiuSchool of Microelectronics, Xidian University, Xi'an 710071, China.
Changqing XuGuangzhou Institute of Technology, Xidian University, Guangzhou 510555, China.ORCID 0000-0002-3827-8820
Yintang YangSchool of Microelectronics, Xidian University, Xi'an 710071, China.ORCID 0000-0001-9745-5404

Funding

Guangdong Basic and Applied Basic Research Foundation 2025A1515012058Natural Science Basic Research Program of Shaanxi 2025JC-YBQN-822Postdoctoral Fellowship Program of China Postdoctoral Science Foundation GZC20232030Shenzhen Science and Technology Program KJZD20240903100506009
6 · The paper itself

Abstract

In this paper, a systematic study on performance degradation of a 0.18 μm BCD-process DCAP (Direct connection to the output CAPacitor) power chip under a total-dose radiation environment is carried out. The effects of total-dose radiation on the electrical characteristics of an MOS device are analyzed through device-level simulation. Based on the simulation results, a total-dose fault injection model is established and applied to a circuit-level simulation of the DCAP power chip. Our simulation modeling and analysis results show that total-dose radiation degrades output voltage accuracy and switching frequency, to which the bandgap reference circuit is identified as the most sensitive module. The findings presented in this paper provide theoretical support for total-dose radiation hardening designs for the DCAP power chip.

Indexed as

fault injection modelpower chipradiation sensitivity analysistotal ionizing dose effect

Identifiers

PMID40872424
PMCPMC12388713

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.