Evidence map›Paper›PMID 40872345›Full record

ArticleMicromachines2025

The Effect of Scratch-Induced Microscale Surface Roughness on Signal Transmission in Radio Frequency Coaxial Connectors.

Yuqi Zhou, Tianmeng Zhang, Gang Xie, Jinchun Gao

Abstract read
In one paragraph

Article in Micromachines, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

4 authors.

Yuqi ZhouBeijing Key Laboratory of Work Safety Intelligent Monitoring, Beijing University of Posts and Telecommunications (BUPT), Beijing 100876, China.ORCID 0009-0001-1825-4258
Tianmeng ZhangBeijing Key Laboratory of Work Safety Intelligent Monitoring, Beijing University of Posts and Telecommunications (BUPT), Beijing 100876, China.
Gang XieSchool of Information and Communication Engineering, Beijing University of Posts and Telecommunications (BUPT), Beijing 100876, China.ORCID 0000-0002-8712-8888
Jinchun GaoBeijing Key Laboratory of Work Safety Intelligent Monitoring, Beijing University of Posts and Telecommunications (BUPT), Beijing 100876, China.ORCID 0000-0002-1280-4212

Funding

the National Key R&D Program of China under grant number 2022YFF0605904the Specialized Scientific Research Projects of Chinese Institute of Electronics and Beijing Smart-chip Microelectronics Technology Co., Ltd. No Grant Number
6 · The paper itself

Abstract

Electrical connectors play a vital role in ensuring reliable signal transmission in high-frequency microsystems. This study explores the impact of microscale scratch-induced surface roughness on the alternating current (AC) contact impedance of RF coaxial connectors. Unlike traditional approaches that assume idealized surface conditions, controlled micro-defects were introduced at the central contact interface to establish a quantitative relationship between surface morphology and signal degradation. An equivalent circuit model was constructed to account for local impedance variations and the cumulative effects of cascaded connector interfaces. The model was validated using S-parameter measurements obtained from vector network analyzer (VNA) testing, showing strong agreement with simulation results. Experimental results reveal that the low-roughness (0.4 μm) contact surfaces lead to degraded signal integrity due to insufficient micro-contact formation. In contrast, scratch-induced moderate roughness (0.8-4.8 μm) improves transmission performance, although signal quality declines as roughness increases within this range. These effects are further amplified in multi-connector configurations due to accumulated impedance mismatches. This work provides new insight into the coupling between microscale surface features and frequency-domain transmission characteristics, offering practical guidance for surface engineering, contact design, and the development of miniaturized, high-reliability radio frequency interconnects for next-generation communication systems.

Indexed as

contact impedanceequivalent circuit modelingmicroscale scratchesmicrosystems reliabilityminiaturized interconnectsRF coaxial connectorsignal integritysurface roughness

Identifiers

PMID40872345
PMCPMC12388555

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.