Evidence map›Paper›PMID 40872022›Full record

ArticleSensors (Basel, Switzerland)2025

Authentication of Counterfeit Electronics Using Rapid THz Time-of-Flight Imaging.

Hyeonseung Ryu, Byung Hee Son, Jihwan Kim, Jangsun Kim, Yeong Hwan Ahn

Abstract read
In one paragraph

Article in Sensors (Basel, Switzerland), 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

5 authors.

Hyeonseung RyuDepartment of Physics and Department of Energy Systems Research, Ajou University, Suwon 16499, Republic of Korea.
Byung Hee SonDepartment of Physics and Department of Energy Systems Research, Ajou University, Suwon 16499, Republic of Korea.
Jihwan KimDepartment of Physics and Department of Energy Systems Research, Ajou University, Suwon 16499, Republic of Korea.
Jangsun KimPanoptics Corp., Seongnam 13516, Republic of Korea.ORCID 0000-0002-6425-4961
Yeong Hwan AhnDepartment of Physics and Department of Energy Systems Research, Ajou University, Suwon 16499, Republic of Korea.ORCID 0000-0002-8563-076X

Funding

National Research Foundation of Korea 2021R1A6A1A10044950National Research Foundation of Korea RS-2024-00335942
6 · The paper itself

Abstract

In this study, we used rapid terahertz (THz) time-of-flight (ToF) imaging to identify counterfeit electronics prevalent in the online market. THz-ToF allows the nondestructive reflection imaging of portable electronic devices enclosed by plastic cases with a spatial resolution of 1 mm and a depth range larger than 5 mm. For instance, we could identify a counterfeit solid-state device because there was a striking difference in the internal structure compared with that of an authentic device, although its appearance was similar. It is also possible to authenticate small portable devices with arbitrary shapes, such as earphones; THz-ToF imaging can be applied to authentication from a variety of perspectives. Importantly, our technique is particularly useful for identifying the inappropriate use of integrated circuit (IC) chips, such as controller chips in USB hub devices. THz-TDS images for various portable and wearable devices will be useful for rapid in-line authentication of products and will offer an effective tool for identifying fake electronics and the inappropriate use of IC chips in various equipment.

Indexed as

authenticationnondestructive testingterahertz imagingtime-of-flight

Identifiers

PMID40872022
PMCPMC12390616

What OpenQuestion holds

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.