Evidence map›Paper›PMID 40866618›Full record

ArticleNature materials2025

High-quality narrow black phosphorus nanoribbons with nearly atomically smooth edges and well-defined edge orientation.

Teng Zhang, Youxin Chen, Zhiyan He, Qinran Liu, Le Chen, Kai Wang, Wenzhe Chen, Kunchan Wang, Xiaowo Ye, Zhuoyang He and 12 more

Abstract read
PubMed Publisher
In one paragraph

Article in Nature materials, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 4 papers.

0numbers the graph read from it
0cells of the map it votes in
4citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

4 citing papers in PubMed.

  1. Article
  2. Article
  3. Article
  4. Review
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

22 authors.

Teng Zhang *National Key Laboratory of Advanced Micro and Nano Manufacture Technology, Department of Micro/Nano Electronics, School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai, China.
Youxin Chen *National Key Laboratory of Advanced Micro and Nano Manufacture Technology, Department of Micro/Nano Electronics, School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai, China.
Zhiyan He *National Key Laboratory of Advanced Micro and Nano Manufacture Technology, Department of Micro/Nano Electronics, School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai, China.
Qinran LiuNational Key Laboratory of Advanced Micro and Nano Manufacture Technology, Department of Micro/Nano Electronics, School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai, China.
Le ChenNational Key Laboratory of Advanced Micro and Nano Manufacture Technology, Department of Micro/Nano Electronics, School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai, China.
Kai WangNational Key Laboratory of Advanced Micro and Nano Manufacture Technology, Department of Micro/Nano Electronics, School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai, China.
Wenzhe ChenCollege of Materials Science and Engineering, Fuzhou University, Fuzhou, China.
Kunchan WangNational Key Laboratory of Advanced Micro and Nano Manufacture Technology, Department of Micro/Nano Electronics, School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai, China.
Xiaowo YeNational Key Laboratory of Advanced Micro and Nano Manufacture Technology, Department of Micro/Nano Electronics, School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai, China.
Zhuoyang HeDepartment of Electrical and Computer Engineering, University of Waterloo, Waterloo, Ontario, Canada.
Yuyang ZhangNational Key Laboratory of Advanced Micro and Nano Manufacture Technology, Department of Micro/Nano Electronics, School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai, China.
Yanming ZhangNational Key Laboratory of Advanced Micro and Nano Manufacture Technology, Department of Micro/Nano Electronics, School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai, China.
Chenghao LiaoNational Key Laboratory of Advanced Micro and Nano Manufacture Technology, Department of Micro/Nano Electronics, School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai, China.
Yuan HeNational Key Laboratory of Advanced Micro and Nano Manufacture Technology, Department of Micro/Nano Electronics, School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai, China.
Wenpei GaoState Key Laboratory of Metal Matrix Composites, School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, China.ORCID http://orcid.org/0000-0002-2776-2676
Tianyu ZhangState Key Laboratory of Metal Matrix Composites, School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, China.
Bei HuNational Key Laboratory of Advanced Micro and Nano Manufacture Technology, Department of Micro/Nano Electronics, School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai, China.
Shenghao JiangNational Key Laboratory of Advanced Micro and Nano Manufacture Technology, Department of Micro/Nano Electronics, School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai, China.
Fangyuan ShiNational Key Laboratory of Advanced Micro and Nano Manufacture Technology, Department of Micro/Nano Electronics, School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai, China.
Shengguang GaoNational Key Laboratory of Advanced Micro and Nano Manufacture Technology, Department of Micro/Nano Electronics, School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai, China.
Xinyue LiNational Key Laboratory of Advanced Micro and Nano Manufacture Technology, Department of Micro/Nano Electronics, School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai, China.
Changxin ChenNational Key Laboratory of Advanced Micro and Nano Manufacture Technology, Department of Micro/Nano Electronics, School of Integrated Circuits, Shanghai Jiao Tong University, Shanghai, China. chen.c.x@sjtu.edu.cn.ORCID http://orcid.org/0000-0002-5444-4921

Funding

Changjiang Scholar Program of Chinese Ministry of Education (Changjiang Scholar Program of Ministry of Education of China) No. Q2017081National Natural Science Foundation of China (National Science Foundation of China) No. 62074098National Natural Science Foundation of China (National Science Foundation of China) No. 62475151
6 · The paper itself

Abstract

Black phosphorus nanoribbons (BPNRs) with a tunable bandgap and intriguing electronic and optical properties hold strong potential for logic applications. However, efficiently producing high-quality BPNRs with precise control over their size and structure remains a great challenge. Here we achieved high-quality, narrow and clean BPNRs with nearly atomically smooth edges and well-defined edge orientation at high yield (up to ~95%) through the sonochemical exfoliation of the synthesized bulk BP crystals with a slightly enlarged lattice parameter along the armchair direction. The resulting BPNRs have widths centred at 32 nm and can be as narrow as 1.5 nm, with edges consistently aligned along the zigzag direction in measured BPNRs with widths ≤340 nm. The formation of one-dimensional BPNRs with zigzag edges is attributed to the introduction of pre-stress along the armchair direction of the grown bulk BP and the application of suitable sonication conditions. The BPNR bandgap increases as the BPNR width decreases from 83 nm to 13 nm, with a large bandgap of 0.64 eV for a 13-nm-wide BPNR. A typical graphene-contacted field-effect transistor fabricated with a 13-nm-wide and 10-nm-thick BPNR can achieve an on/off ratio of 1.7 × 10

Identifiers

What OpenQuestion holds

Textmetadata
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.