ArticleSmall (Weinheim an der Bergstrasse, Germany)2025
High-Speed Quantitative Nanomechanical Mapping by Photothermal Off-Resonance Atomic Force Microscopy.
Article in Small (Weinheim an der Bergstrasse, Germany), 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 5 papers.
What it found
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Who cites it
5 citing papers in PubMed.
- Prediction-Based Algorithms for Long-Range High-Speed Force Spectroscopy.Journal of molecular recognition : JMR · 2026Article
- Designing Thermomechanically Stable Nanocrystalline Alloys for Low Friction and Wear: A Perspective.ACS applied materials & interfaces · 2026Review
- Lipid Saturation and Cholesterol Drive the Mechanical Response of Lipid Bilayer to Ionic Liquid: An Atomic Force Microscopy Study.Langmuir : the ACS journal of surfaces and colloids · 2026Article
- Advances in nanomechanical property mapping by atomic force microscopy.Nanoscale advances · 2025Review
- High-Speed Quantitative Nanomechanical Mapping by Photothermal Off-Resonance Atomic Force Microscopy.Small (Weinheim an der Bergstrasse, Germany) · 2025Article
Corrections and comments
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Authors and funding
5 authors.
Funding
No grant is acknowledged in the PubMed record.
Abstract
Atomic force microscopy (AFM) is widely used to measure surface topography of solid, soft, and living matter at the nanoscale. Moreover, by mapping forces as a function of distance to the surface, AFM can provide a wealth of information beyond topography, with nanomechanical properties as a prime example. Here, a method based on photothermal off-resonance tapping (PORT) is presented to increase the speed of such force spectroscopy measurements by at least an order of magnitude, thereby enabling high-throughput, quantitative nanomechanical mapping of a wide range of materials. Specifically, photothermal actuation is used to modulate the position of the AFM probe at frequencies that far exceed those possible with traditional actuation by piezo-driven z scanners. Understanding and accounting for the microscale thermal and mechanical behavior of the AFM probe, the study determines the resulting probe position at sufficient accuracy to allow rapid and quantitative nanomechanical examination of polymeric and metallic materials.
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Registered trials
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