Evidence map›Paper›PMID 40808624›Full record

ArticleMicroscopy research and technique2026

Influence of RF Power on Structural and Corrosion Properties of Sputter-Deposited CrN Films.

Alireza Grayeli, Sahar Rezaee, Ştefan Ţălu

Abstract read
In one paragraph

Article in Microscopy research and technique, 2026. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

3 authors.

Alireza GrayeliPhysics and Accelerators Research School, Nuclear Science & Technology Research Institute, Tehran, Iran.ORCID https://orcid.org/0000-0003-2214-7014
Sahar RezaeeDepartment of Physics, Ker. C., Islamic Azad University, Kermanshah, Iran.ORCID https://orcid.org/0000-0001-5034-0810
Ştefan ŢăluThe Directorate of Research, Development and Innovation Management (DMCDI), Technical University of Cluj-Napoca, Cluj-Napoca, Romania.ORCID https://orcid.org/0000-0003-1311-7657

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

This study examines the deposition of chromium nitride (CrN) films on 304 stainless steel (304SS) substrates using radio-frequency (RF) magnetron sputtering, with RF power varied from 20 to 160 W in an argon atmosphere. The structural, topographical, and corrosion resistance properties of the films were analyzed using X-ray diffraction (XRD), atomic force microscopy (AFM), scanning electron microscopy (SEM), and electrochemical polarization measurements. Employing the atomic force microscope, morphological characteristics of CrN films under constant conditions using Minkowski Functionals were analyzed. Subsequently, by examining parameters like root-mean-square roughness, skewness, and kurtosis, the study revealed the variations in the particle distribution and their probability density as a function of deposition power alterations. Results indicate that increasing RF power enhances film crystallinity, as evidenced by intensified XRD peaks. With an increase in RF power reaching up to 80 W, there is a significant enhancement in the uniformity of the surface, resulting in an evenly spread grain pattern. Corrosion tests in 0.5 M sulfuric acid, assessed via potentiodynamic polarization, identify 80 W as the optimal RF power for maximizing corrosion resistance. This study provides insights into the relationship between film structure, surface characteristics, and corrosion behavior, highlighting key factors influencing protective performance.

Indexed as

CrN filmsMinkowski functionalpotentiodynamic polarizationsurface micromorphologyx‐ray diffraction

Identifiers

PMID40808624
PMCPMC12696611

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.