Evidence map›Paper›PMID 40776810›Full record

ArticleSmall (Weinheim an der Bergstrasse, Germany)2025

Synthesis-Related Nanoscale Defects in Mo-Based Janus Monolayers Revealed by Cross-Correlated AFM and TERS Imaging.

Tianyi Zhang, Andrey Krayev, Tilo H Yang, Nannan Mao, Lauren Hoang, Zhien Wang, Hongwei Liu, Yu-Ren Peng, Yunyue Zhu, Xudong Zheng and 8 more

Abstract read
PubMed Full text at PMC Publisher
In one paragraph

Article in Small (Weinheim an der Bergstrasse, Germany), 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 2 papers.

0numbers the graph read from it
0cells of the map it votes in
2citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

2 citing papers in PubMed.

  1. Review
  2. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

18 authors.

Tianyi ZhangDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.ORCID https://orcid.org/0000-0002-8998-3837
Andrey KrayevHORIBA Scientific, Novato, CA, 94949, USA.
Tilo H YangDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
Nannan MaoDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
Lauren HoangDepartment of Electrical Engineering, Stanford University, Stanford, CA, 94305, USA.
Zhien WangDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
Hongwei LiuDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
Yu-Ren PengDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
Yunyue ZhuDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
Xudong ZhengDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
Eleonora IsottaDepartment of Materials Science and Engineering, Northwestern University, 2220 Campus Drive, Evanston, IL, 60208, USA.
Maria E KiraDepartamento de Física, Universidade Federal de Minas Gerais, Av. Antônio Carlos, 6627, Pampulha, Belo Horizonte, Minas Gerais, 31270-901, Brazil.
Ariete RighiDepartamento de Física, Universidade Federal de Minas Gerais, Av. Antônio Carlos, 6627, Pampulha, Belo Horizonte, Minas Gerais, 31270-901, Brazil.
Marcos A PimentaDepartamento de Física, Universidade Federal de Minas Gerais, Av. Antônio Carlos, 6627, Pampulha, Belo Horizonte, Minas Gerais, 31270-901, Brazil.
Yu-Lun ChuehDepartment of Materials Science and Engineering, National Tsing Hua University, Hsinchu, 30013, Taiwan.
Eric PopDepartment of Electrical Engineering, Stanford University, Stanford, CA, 94305, USA.
Andrew J MannixDepartment of Materials Science & Engineering, Stanford University, Stanford, CA, 94305, USA.
Jing KongDepartment of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.ORCID https://orcid.org/0000-0003-0551-1208

Funding

Air Force Office of Scientific Research FA2386-24-1-4049Basic Energy Sciences DE-SC0020042CNPqFapemigU.S. Department of Energy, Office of Science
6 · The paper itself

Abstract

2D Janus transition metal dichalcogenides (TMDs) are promising candidates for various applications including non-linear optics, energy harvesting, and catalysis. These materials are usually synthesized via chemical conversion of pristine TMDs. Nanometer-scale characterization of the obtained Janus materials' morphology and local composition is crucial for both the synthesis optimization and the future device applications. In this work, we present the results of cross-correlated atomic force microscopy (AFM) and tip-enhanced Raman spectroscopy (TERS) study of Janus monolayers synthesized by the hydrogen plasma-assisted chemical conversion of MoSe

Indexed as

2D materialsatomic force microscopyJanus transition metal dichalcogenidesnanoscale defectstip‐enhanced Raman spectroscopy

Identifiers

PMID40776810
PMCPMC12444857

What OpenQuestion holds

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.