Evidence map›Paper›PMID 40698244›Full record

ArticleNational science review2025

Deposition of uniform films on complex 3D objects by atomic layer deposition for plasma etch-resistant coatings.

Xin Han, Yixian Wang, Yumo Tian, Yafeng Wang, Lipei Peng, Chunlei Pei, Tuo Wang, Jinlong Gong

Abstract read
In one paragraph

Article in National science review, 2025. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.

0numbers the graph read from it
0cells of the map it votes in
3citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

3 citing papers in PubMed.

  1. Review
  2. Review
  3. Review
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

8 authors.

Xin HanSchool of Chemical Engineering & Technology, Key Laboratory for Green Chemical Technology of Ministry of Education, Tianjin University; Collaborative Innovation Center for Chemical Science & Engineering; Tianjin 300072, China.
Yixian WangSchool of Chemical Engineering & Technology, Key Laboratory for Green Chemical Technology of Ministry of Education, Tianjin University; Collaborative Innovation Center for Chemical Science & Engineering; Tianjin 300072, China.
Yumo TianSchool of Chemical Engineering & Technology, Key Laboratory for Green Chemical Technology of Ministry of Education, Tianjin University; Collaborative Innovation Center for Chemical Science & Engineering; Tianjin 300072, China.
Yafeng WangSchool of Chemical Engineering & Technology, Key Laboratory for Green Chemical Technology of Ministry of Education, Tianjin University; Collaborative Innovation Center for Chemical Science & Engineering; Tianjin 300072, China.
Lipei PengPeric Special Gases Co., Ltd, Handan 056002, China.
Chunlei PeiSchool of Chemical Engineering & Technology, Key Laboratory for Green Chemical Technology of Ministry of Education, Tianjin University; Collaborative Innovation Center for Chemical Science & Engineering; Tianjin 300072, China.
Tuo WangSchool of Chemical Engineering & Technology, Key Laboratory for Green Chemical Technology of Ministry of Education, Tianjin University; Collaborative Innovation Center for Chemical Science & Engineering; Tianjin 300072, China.ORCID https://orcid.org/0000-0002-9862-5038
Jinlong GongSchool of Chemical Engineering & Technology, Key Laboratory for Green Chemical Technology of Ministry of Education, Tianjin University; Collaborative Innovation Center for Chemical Science & Engineering; Tianjin 300072, China.ORCID https://orcid.org/0000-0001-7263-318X

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Atomic layer deposition (ALD) is a layer-by-layer technique for producing conformal, high-quality films, ideal for corrosion-resistant coatings on complex geometries. However, depositing thicker films on complex 3D objects presents challenges in maintaining effective precursor delivery across the surface. This paper describes the design and realization of a method to increase precursor concentration in the boundary layer near the complex object surface by introducing slitted baffles within the chamber. Using -OH surface coverage as a key indicator for assessing the extent of surface reactions, simulation is used to optimize the baffle number and shape. The optimal baffle design reduced surface film non-uniformity on the object surface from 35.46% to 5.75%, shortened the purge time from 12.8 to 9.7 s, and increased precursor utilization by 7%. Ideal Al

Indexed as

3D object depositionatomic layer depositionetch-resistant coatingfilm uniformityplasma etchingthin film

Identifiers

PMID40698244
PMCPMC12281629

What OpenQuestion holds

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.